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2003-09-15 Toshiba deploys Keithley IC test system
Toshiba Corp. has selected Keithley Instruments' S630DC/RF parametric test system to support production of its new generation of semiconductors.
2006-03-16 Rx: New test techniques
New measurement approaches require faster and more efficient and reliable instrumentation and software.
2009-12-01 RF parametric test handles 3G, LTE, WLAN
Aeroflex has launched the 7000 series vector analyzer generator (VAG), a single-, fully-integrated RF parametric test system for RF test of wireless components and subsystems.
2008-02-01 Parametric probe cards reduce cost of tests at 45nm
Cascade Microtech has launched two new Pyramid parametric probe cards that allow single-pass high performance DC and RF measurements and reduce the cost of parametric production test for advanced process nodes at 65nm, 45nm and beyond.
2008-02-05 Parametric probe cards cut testing costs at 45nm, beyond
Cascade Microtech has introduced two new Pyramid parametric probe cards that allow single-pass high-performance DC and RF measurements and reduce the cost of parametric production test for semiconductors at 65nm, 45nm and beyond.
2008-06-12 Multiformat mobile WiMAX/WLAN test rolls
Agilent Technologies Inc. has shipped the first in a series of planned software products based on the Sequans SQN1130 chipset for WiMAX mobile stations.
2011-08-08 Method of implementation for HDMI 1.4a cable assembly test using network analyzer
Read about a test procedure for the parametric test with the Agilent E5071C ENA Network Analyzer Option TDR.
2013-02-25 Memory test tip: Boost flash memory testing
Know how to tune your test system parameters to get the optimal results
2007-07-23 Linux-based parametric test systems debut
Keithley Instruments' S600 Series Parametric Test Systems migrated to the Linux OS on the embedded control computer within each test system.
2008-01-16 Keithley updates ACS test software
Keithley Instruments' updated Automated Characterization Suite V3.2 software enhances the powerful automation capabilities of ACS integrated test systems
2003-12-10 Keithley device tests 300mm wafers in 200mm test times
Keithley Instruments Inc. has expanded its S600 series with the release of the S680DC/RF parametric test system that allows control of 300mm wafer processes in 200mm test times. The optional SimulTest parallel test software measures up to nine devices simultaneously within a single probe touchdown.
2008-02-19 Handheld radio test set comes with spectrum analyzer option
Aeroflex has released an RF spectrum analyzer option for the 3500 handheld 1GHz radio test set. The spectrum analyzer option now allows users to see the signals they are receiving
2008-12-11 Component test solution: move over obsolete curve tracers
Keithley Instruments Inc. announces ACS Basic Edition, a characterization and curve tracer software for component test applications. ACS Basic Edition, pared with SourceMeter instruments, replaces obsolete curve tracers with a solution that performs both basic curve tracing and parametric test.
2006-10-05 Agilent adds test option to accelerate yield ramp-up phase
Agilent announced a new parametric test option that claims to accelerate the yield ramp-up phase for IC makers.
2004-02-02 Vectorless test: Best bet for high-speed I/O
An approach called vectorless test is emerging that offers the best of both approaches: the cost effectiveness of on-chip I/O BIST combined with ATE-based signal integrity measurements
2001-04-23 Using NAND tree test circuits for input parametric testing
This application note discusses how to implement a simple NAND tree test structure for input parametric testing of ASIC designs.
2008-05-30 USB modules match electronic functional test
Agilent Technologies Inc. has introduced a family of USB-based instruments designed for flexible configurations, quick setup, and affordability in electronic functional test and troubleshooting applications
2011-08-25 Upgraded PXI platform cuts test times, costs
NI has expanded the capabilities of its PXI platform for semiconductor characterization and production test with new per-pin parametric measurement unit modules and source measure unit modules.
2008-01-11 TTA to use Agilent's Mobile WiMAX test solution
The Telecommunications Technology Association has awarded Agilent Technologies Inc. a contract for Mobile WiMAX Protocol Conformance Test
2010-02-23 Tests system extends test environment life cycle
Aeroflex has rolled out the SMART^E 5300 DC to 40GHz general-purpose test environment that tests, monitors and controls any device under test (DUT) within a single test environment
2012-02-28 Test suite supports WLAN 802.11ac measurement
The PXI 3000 series test system from Aeroflex performs parametric measurements for manufacturing.
2012-03-19 Test sol'ns ease integration of PCIe 3.0 in Intel Xeon processors
Tektronix products that support development of the processors include DPO/DSA/MSO70000 series oscilloscopes, TLA7SA16/TLA7SA08 logic protocol analyzer modules and TLA7000 series logic analyzers.
2007-05-14 Test software enables enterprise-wide collaboration
VI Technology Inc.'s Arendar 2007 test platform expands on the highly-configurable and expandable Arendar platform to provide instant access to design, characterization, validation and verification, and manufacturing test information across the enterprise
2011-07-04 Test set supports RF parametic, protocol testing
Aeroflex's options 103 and 105 for the 7100 LTE digital radio test set facilitate testing for multimode communication devices
2008-08-29 Test companies live up to the WiMAX challenge
In an effort to put complete WiMAX analysis in the hands of RF designers, test and measurement companies continue to develop software upgrades, spectrum analyzers, test sets and network analyzers to comply with the rapid build out of these wireless networks
2002-11-05 Telco purchases Motorola test equipment business
Motorola Inc. has entered into an agreement to sell the equipment repair and manufacturing assets of its Motorola Manufacturing Solutions test equipment business to Telco Inc
2007-07-17 Software test suite rolls for 3GPP LTE products
Agilent Technologies announced the availability of its Signal Studio for 3GPP Long Term Evolution (LTE) software.
2004-11-03 Software promises realtime test, product quality, performance insight
SigmaQuest is rolling out a new product that provides actionable information that can help ensure product intergrity and process integrity.
2010-04-26 PXI measurement suite cuts TD-SCDMA test costs
From Aeroflex comes the PXI 3030 TD-SCDMA measurement suite designed to provide fast and cost-effective production testing of mobile handsets and RFICs.
2007-09-12 One-box wireless networking test set targets mobile WiMAX
Agilent Technologies unveiled a wireless networking test set and OFDMA measurement application software, forming a complete one-box transmitter and receiver test solution for mobile WiMAX devices
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