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2001-04-23 Using NAND tree test circuits for input parametric testing
This application note discusses how to implement a simple NAND tree test structure for input parametric testing of ASIC designs.
2003-04-23 UMC adopts Agilent solution for 300mm wafer testing
Semiconductor foundry United Microelectronics Corp. has selected Agilent Technologies' 4070|300 system for fully automated 300mm wafer parametric testing.
2008-02-01 Parametric probe cards reduce cost of tests at 45nm
Cascade Microtech has launched two new Pyramid parametric probe cards that allow single-pass high performance DC and RF measurements and reduce the cost of parametric production test for advanced process nodes at 65nm, 45nm and beyond
2008-02-05 Parametric probe cards cut testing costs at 45nm, beyond
Cascade Microtech has introduced two new Pyramid parametric probe cards that allow single-pass high-performance DC and RF measurements and reduce the cost of parametric production test for semiconductors at 65nm, 45nm and beyond
2009-04-01 LTE test system promises complete RF testing
AT4 wireless has unveiled the T4010 LTE RF test system, a complete and cost-effective platform to perform RF parameter verification throughout the development life of LTE-enabled user equipment.
2007-07-24 Keithley, French lab enter nanotech testing pact
Keithley has agreed to jointly develop advanced nanotechnology and chip materials testing technology with France's CEA Leti Laboratory
2011-12-09 Two-stage MIMO over-the-air testing
Read about the methods of MIMO over-the-air testing, and find out why the two-stage method has the advantage of being fast, efficient and flexible
2014-05-02 Testing as an art (Part 3
This instalment relates some of the lessons I have learned.
2011-07-04 Test set supports RF parametic, protocol testing
Aeroflex's options 103 and 105 for the 7100 LTE digital radio test set facilitate testing for multimode communication devices
2008-07-23 Software upgrade supports higher power testing
Keithley Instruments Inc. has introduced Keithley Test Environment Interactive (KTEI) V7.1 for the company's Model 4200-SCS Semiconductor Characterization System.
2009-12-01 RF parametric test handles 3G, LTE, WLAN
Aeroflex has launched the 7000 series vector analyzer generator (VAG), a single-, fully-integrated RF parametric test system for RF test of wireless components and subsystems
2013-02-25 Memory test tip: Boost flash memory testing
Know how to tune your test system parameters to get the optimal results.
2005-08-01 Fast parametric measurement-unit chips have small footprints
Semtech's new family of BiCMOS ICs appeal to those developing automatic test equipment.
2008-11-20 Digital radio test targets 3G LTE testing
Aeroflex has released the 7100 digital radio test set designed to enable chipset designers, software developers and handset manufacturers to accelerate the pace of development projects to meet the requirements of 3G LTE.
2006-07-01 DFM tool targets parametric yield
Blaze DFM Inc. recently rolled out Blaze MO, said to be the first "electrical" DFM solution.
2009-07-29 Aeroflex, w2bi work on LTE testing platform
Aeroflex and w2bi have agreed to pool their test expertise and technology for the joint development of a network certification platform for LTE mobile devices.
2006-03-16 Rx: New test techniques
New measurement approaches require faster and more efficient and reliable instrumentation and software.
2003-01-02 GbE test challenges on the manufacturing floor
Developing test systems for GbE products requires the test engineer to fully understand the operation of the product, Gb Ethernet standards and the general manufacturing processes.
2003-03-12 Avnet business unit inks distribution pact with Zcomax
Avnet RF & Microwave's Wavelength Design Solutions has signed an agreement with Zcomax Technologies Inc. to market Avnet solutions throughout North America.
2008-07-01 WiMAX Wave 2 tests commence
Even as WiMAX technology begins riding its first wave of deployment, second-generation equipment design is entering the water. WiMAX developers are targeting what they call Wave 2 development, which aims to increase security and performance in fixed and mobile applications.
2011-08-25 Upgraded PXI platform cuts test times, costs
NI has expanded the capabilities of its PXI platform for semiconductor characterization and production test with new per-pin parametric measurement unit modules and source measure unit modules
2008-01-11 TTA to use Agilent's Mobile WiMAX test solution
The Telecommunications Technology Association has awarded Agilent Technologies Inc. a contract for Mobile WiMAX Protocol Conformance Test.
2003-09-15 Toshiba deploys Keithley IC test system
Toshiba Corp. has selected Keithley Instruments' S630DC/RF parametric test system to support production of its new generation of semiconductors
2013-12-18 SoC design success hinges on IP passing JEDEC tests
When SoC designers purchase an IP block, they must be assured that after it is incorporated into a larger system, it will pass reliability testing and will last at least a decade in the field
2010-06-08 Mobile WiMAX PHY layer (RF) operation and measurement
This application note is intended for engineers developing and testing mobile or subscriber stations (MS or SS) and their components, based on the IEEE 802.16e OFDMA amendment to the 802.16-2004 standard
2011-08-08 Method of implementation for HDMI 1.4a cable assembly test using network analyzer
Read about a test procedure for the parametric test with the Agilent E5071C ENA Network Analyzer Option TDR
2003-12-10 Keithley device tests 300mm wafers in 200mm test times
Keithley Instruments Inc. has expanded its S600 series with the release of the S680DC/RF parametric test system that allows control of 300mm wafer processes in 200mm test times. The optional SimulTest parallel test software measures up to nine devices simultaneously within a single probe touchdown
2007-09-19 Instruments advance chip test productivity
Keithley Instrumnets has expanded its product line for semiconductor characterization and production tests.
2002-03-21 Agilent improves test solution for CDMA2000 1xEV-DO
The company has announced the release of an enhanced CDMA2000 1xEV-DO Signal Studio test software designed specifically for the company's E4438C ESG vector signal generator.
2006-10-05 Agilent adds test option to accelerate yield ramp-up phase
Agilent announced a new parametric test option that claims to accelerate the yield ramp-up phase for IC makers
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