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2006-10-31 Synopsys unveils DFM tools for 45nm, beyond
Synopsys has unveiled a new family of process-aware DFM products that analyze variability effects at the custom/analog design stage for 45nm and smaller designs.
2011-10-11 Synopsys acquires parametric analysis firm
The EDA company has acquired Extreme DA to expand its timing analysis solutions and multicore software development capabilities.
2005-08-01 RF IC tools still seeking paths to silicon
Complicated by multiple modulation schemes, RF tools have become proficient at simulating behavior on an architectural level
2005-03-16 PC-based tools lower barrier to MEMS
Take a closer look at how low-cost PC-based tools can help hurdle the challenges in MEMS design
2007-03-16 Electrical DFM promises gains in parametric yield
Design techniques are under greater pressure to provide equivalent scaling to enable the semiconductor road map to continue in a cost-effective way.
2007-10-01 Drive parametric yields higher at 65nm, beyond
The need to characterize and model intrinsic variability in a production-worthy process will intensify and represent a new imperative for improving yield in 65nm process technologies and beyond. A PAM platform methodology can foster a collaborative environment between design and manufacturing, a condition key to driving parametric yields higher
2006-07-01 DFM tool targets parametric yield
Blaze DFM Inc. recently rolled out Blaze MO, said to be the first "electrical" DFM solution.
2005-03-16 CAD tools shrink small world of MEMS design
Manufacturers are leveraging microdesign technologies to develop MEMS and small devices to satisfy market demand for miniaturization.
2012-04-20 Significance of signal chains and PLC
Know the importance of PLCs, and learn how to choose component parts using the parametric tools on Maxim's website.
2006-06-01 Startup enables IC variability characterization
In a bid to enable silicon fabs to provide statistical parametric characterization, Stratosphere Solutions Inc. recently introduced intellectual property that inserts test structures in silicon wafers
2005-08-26 Is automotive industry the 'next big wave' for EDA?
Largely missed in the rubble after Mentor Graphics Corp. slashed second half guidance following disappointing second quarter bookings last month was a statement by Chairman and CEO Walden Rhines that could offer a ray of future hope for the company and the EDA industry as a whole.
2007-06-01 IC designers favor less complex DFM
During the IEEE Electronic Design Process workshop, IC design experts point out that current approaches to design-for-manufacturing (DFM) may be yielding too little for the amount of effort and cost involved.
2014-03-07 Exploring circuit design in FinFET technology
Know some of the things that could affect the learning and cost curve with regard to the use of FinFET.
2006-09-01 EDA app shows variants of IC design
DFM tool provider Aprio Technologies Inc. has developed an application extension, Halo-Quest, designed to fit on top of EDA design and analysis tools, and to generate accurate silicon image representation of IC designs for use within design flows
2007-03-16 DFM demands holistic approach
The infrastructure required to make trade-offs among the different techniques and determine the optimal approach should be one where the actual software takes into account the implications of other DFM issues. The idea is to create a holistic approach to DFM for the design and analysis flow.
2005-03-16 Design-for-manufacturability a must
Detailed processes and material-property characterization done early in the design phase can save cost and time in the manufacturing stage.
2008-03-17 Bring DFM/DFY into the routing engine
In reality, DFM/DFY tools need to use a mixture of rules- and model-based techniques as appropriate. The solution is to bring DFM/DFY upstream into the design process; to create a design that is correct by construction; and to hand-off a design that is as manufacturing- and yield-friendly as possible
2007-08-09 Agilent testers support WiMAX Forum's Wave 2 system profiles
Agilent has enhanced its Vector Signal Analyzer, Signal Studio and Mobile WiMAX Test Set measurement solutions to facilitate testing of the WiMAX Forum's Wave 2 system profiles.
2006-12-05 Cell BE platform accelerates optical proximity correction
Mentor Graphics and Mercury Computer Systems are bringing out what they say is the first Cell BE-based acceleration platform for the EDA market.
2014-08-14 Speed up design process with latest solidThinking software
Important features in solidThinking Inspire 2014 include geometry simplification tools, linear static analysis, concentrated mass parts and smoothing options as well as the ability to export solid geometry
2014-11-05 Mentor Graphics ups Flowmaster for thermo-fluid simulation
The latest Flowmaster release contains FMI and has upgraded parametric studies, Monte Carlo simulation, secondary air and natural circulation features
2012-10-24 Keithley combines Curve Tracer's features with parameter analyser
The firm introduced seven instrumentation, software and test fixture configurations for parametric curve tracing applications for characterizing high power devices at up to 3kV and 100A
2015-04-28 Exploring the failure analysis process
Determining the root cause of electronic system failures requires a disciplined and systematic analytical process, along with sophisticated tools for testing and visualizing the behaviours of sample devices
2008-12-11 Component test solution: move over obsolete curve tracers
Keithley Instruments Inc. announces ACS Basic Edition, a characterization and curve tracer software for component test applications. ACS Basic Edition, pared with SourceMeter instruments, replaces obsolete curve tracers with a solution that performs both basic curve tracing and parametric test
2005-09-21 Automated test suite serves second-gen PCI Express
LeCroy's SDA PCI Express (SDA-PCIE-G2) software works in conjunction with its SDA (Serial Data Analyzers) and PCI Express Protocol Analysis and traffic generation tools
2006-12-08 Agilent allies with CWS for test solutions
Agilent announced a formal agreement with Core Wafer Systems, a provider of accelerated and long-term reliability test solutions and analysis tools for the semiconductor test market space
2004-06-08 AccelChip partners with Leopard Logic, ChipX
EDA startup AccelChip Inc., a provider of tools for synthesizable Verilog and VHDL code, has signed separate partnership deals with structured ASIC vendor ChipX and configurable logic vendor Leopard Logic
2008-07-01 WiMAX Wave 2 tests commence
Even as WiMAX technology begins riding its first wave of deployment, second-generation equipment design is entering the water. WiMAX developers are targeting what they call Wave 2 development, which aims to increase security and performance in fixed and mobile applications.
2015-01-07 Using sub-threshold techniques for IC design
The use of sub-threshold techniques can be a powerful way to create circuits that consume dramatically less energy than those built using standard design practices.
2008-06-05 TSMC stirs IC designs using 40nm node
Paving the way for next-generation chips, TSMC is set to roll out its latest design methodology for IC production at the 40nm node.
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