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2006-03-24 Samsung execs face jail in connection with DRAM probe
Three Samsung Electronics executives have agreed to plead guilty and to serve jail time in the United States in conjunction with an alleged global conspiracy to fix DRAM prices.
2004-02-20 RZ system cuts probe mask production time
RZ Enterprises has disclosed that its PS-1000 is the first rapid wafer probe alignment-mask generator for the semiconductor test probe card industry.
2003-06-29 Restoring confidence in your high-bandwidth probe measurements
This application note presents a simple method to verify the performance of various probing configurations.
2002-07-23 Researchers probe photoresists for next-gen ICs
Government, industry and university researchers have joined forces to search for new materials needed for next-generation ICs.
2008-01-14 Report: Probe on Samsung bribery allegations underway
According to an Agence France-Presse report, an independent counsel remarked last week that he had started a probe into bribery and fraud allegations again Samsung Electronics Co. Ltd.
2002-03-08 Reducing TDR probe rod length to improve water content measurements in soils with high electrical conductivity
This application note discusses the effect of electrical conductivity on soil water content measurements.
2015-03-02 R&S bares oscilloscope probe interface
The R&S RT ZC20B current probe from Rohde & Schwarz can measure current conveniently. The interface can measure AC and DC of 30A (RMS)/50A (peak) current with a resolution of 10mA and low noise.
2006-10-27 Probe tests compliance to new high-speed standards
With 13GHz bandwidth and an extended termination voltage range, Tektronix' new probe can be used for serial bus validation and compliance testing of the latest high-speed standards, including the HDMI 1.3 video standard and PCI-Express 2.0.
2009-03-10 Probe system meets new network protocols
Tektronix Communications has released new product enhancements to its GeoProbe monitoring system and Unified Assurance for Converged Networks suite of products that provide fixed, mobile and converged network operators with the necessary capability required to monitor key protocols in IP signaling and transport networks.
2002-03-01 Probe submersible assembly
This application note illustrates how a submersion assembly can be used to ensure that the cable remains dry when the electrode is submerged.
2007-03-22 Probe set for MS-Alcatel-Lucent patent fray
The U.S. International Trade Commission will begin investigating claims by Microsoft that Alcatel-Lucent infringed on its patents for "unified communications" products.
2014-07-09 Probe series touts 1THz high-accuracy measurement
The T-Wave probe series includes millimetre and sub-millimetre wavelength on-wafer ground-signal-ground probes and components for electrical measurement with frequencies up to 1.1THz.
2013-03-25 Probe implant sends health report through Bluetooth
Researchers in Switzerland have developed a tiny personal blood testing laboratory on a chip that gives an immediate analysis of substances in the body and transmits the results over a mobile phone.
2014-09-15 Probe examines how Mars lost water supply
MAVEN is the first probe dedicated to studying the Martian atmosphere and climate in an attempt to determine the fate of the planet's ancient supply of liquid water and thick atmosphere.
2006-06-15 Probe 2000, Best Electronics open probe card ops in the Philippines
Probe 2000 and Best Electronics have agreed to set up a new probe card repair and manufacturing operation in Best Electronics' semiconductor test factory in the Philippines.
2008-02-01 Parametric probe cards reduce cost of tests at 45nm
Cascade Microtech has launched two new Pyramid parametric probe cards that allow single-pass high performance DC and RF measurements and reduce the cost of parametric production test for advanced process nodes at 65nm, 45nm and beyond.
2008-02-05 Parametric probe cards cut testing costs at 45nm, beyond
Cascade Microtech has introduced two new Pyramid parametric probe cards that allow single-pass high-performance DC and RF measurements and reduce the cost of parametric production test for semiconductors at 65nm, 45nm and beyond.
2007-11-01 Oscilloscope probe withstands extreme temperatures
Agilent Technologies has released what it touts as the first probing solution for making oscilloscope measurements in environmental chambers and in other settings with extreme temperature conditions.
2006-02-24 NEC unveils 'smallest' fiber-optic field probe
NEC Corp. announced the successful development of what it touts as the world's smallest fiber-optic electric field probe, enabled through the adoption of a nanotechnology process.
2006-10-18 Mitsubishi hit by SRAM probe
Mitsubishi Electric Corp. received a subpoena from the U.S. Department of Justice Antitrust Division, seeking information about the sales of its SRAM parts in the United States.
2006-08-08 Micromanipulator unveils 300mm manual probe station
Micromanipulator's Model 9020 probe station features motorized drives with interactive manual control via joystick or MicroTouch controls.
2007-11-13 Matsushita among firms in CRT price-fixing probe
Japan antitrust officials last week searched a subsidiary of Matsushita Electric Industrial for evidence pointing to the company's alleged participation in an international CRT price-fixing scheme.
2004-09-01 Logic analysis probe serves Pentium 4 designers
Agilent now has a logic analysis probe for folks designing-in Intel Pentium 4 microprocessors in 775-land packages.
2007-11-27 Korean lawmakers pass bill to probe Samsung scandal
The Korean National Assembly Nov. 22 passed a bill to initiate an independent probe on the alleged bribery practices of Samsung Group, according to the Yanhop News Agency.
2006-11-14 Keithley, Mesatronic team up for wafer probe solution
Keithley Instruments has partnered with Mesatronic to develop advanced probe cards for semiconductor parametric testers used in RF and low-current DC applications.
2008-12-23 ITC to start probe on Spansion complaint
The U.S. International Trade Commission (ITC) has agreed to investigate a complaint by Spansion Inc. against some flash memory chips made by South Korean giant Samsung Electronics Co. Ltd.
2008-01-08 ITC to start probe on four IC complaints
The U.S. International Trade Commission (ITC) has decided to pursue four separate cases filed by IBM Corp., Knowles Electronics LLC, Tessera Inc. and Seoul Semiconductor Co. Ltd.
2008-01-14 Intel faces antitrust probe in New York
Intel Corp. has received a subpoena from the New York Attorney General's office Jan. 10 seeking documents as part of a new investigation alleging anti-competitive business practices.
2008-04-01 Innovative flying probe test, soldering solution debut
Seica has announced its new Pilot V8 flying probe test system and the Firefly selective soldering solution, which will be exhibited at this week's IPC Printed Circuits Expo, Apex and the Designers Summit.
2004-09-20 Infineon agrees to pay $160M fine in U.S. DRAM price-fixing probe
Infineon Technologies AG has agreed to pay a $160 million fine as part of a federal DRAM price-fixing probe, the Justice Department said.
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