Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > Advanced Search > probe

probe Search results

total search626 articles
2010-11-19 IMEC, FP6 create leading-edge neural probe
IMEC, with its partners within the European FP6 Program NeuroProbes, has created a new neural probe allowing electrical and chemical recording as well as stimulation of single neurons in the brain.
2013-08-02 Imec, Cascade probe 25?m-diameter micro-bumps
The organisations revealed breakthroughs in probing stacked ICs (3D-SICs) on a wide I/O test wafer with its fully-automated CM300 probe solution using an advanced version of Pyramid Probe technology.
2004-04-23 IDI plunger probe offers new method for biasing
The Eccentric Plunger Probe is a spring contact probe design developed by Interconnect Devices that introduces a new method for the biasing of probes.
2002-03-25 IC failure analysis and defect inspection with scanning probe microscopy
This application note discusses how AFMs are being applied to more areas in materials characterization and failure analysis applications.
2006-05-24 IBM probe nanometer-scale memories
IBM has taken the wraps off a groundbreaking project to develop terabit memories based on MEMS technology and referred to as "probe-based storage."
2014-12-29 Flying probe testers flaunt high throughput
The A8a test system from atg Luther & Maelzer is equipped with eight test heads and four cameras for optical alignment, geared to test HDI products for smartphones, tablet and PC motherboards.
2008-06-16 Flying probe system touts high-accuracy testing
Aeroflex has released the 4520 standalone flying probe system, a quick, easy and flexible solution to meet a variety of PCB testing needs.
2007-01-19 EU to rule on Intel anti-competition probe
Antitrust investigators have recommended that European Union Competition Commissioner Neelie Kroes formally charge Intel Corp. with illegally thwarting competition in the computer chip market.
2009-09-14 EC to set up panel for Qualcomm patent probe
Antitrust regulators in the European Commission are considering setting up a special panel to unravel the long-drawn out case pending against Qualcomm Inc. concerning patent royalty payments.
2015-07-21 EC probe on Qualcomm's sales practices opens
The European Commission has opened two antitrust investigations into the behaviour of Qualcomm with regard to its market dominance of semiconductors used in consumer electronics.
2003-11-12 Digitaltest releases ICT, flying probe solutions
Digitaltest GmbH has announced that it has developed two electronics manufacturing test and inspection solutions.
2013-07-30 Digital gaging probe system boasts high accuracy
The high-precision digital gaging probe system from Measurement measures manufactured parts during production for automated inspection screening and statistical process control (SPC) data collection.
2006-03-17 Deep-memory oscilloscope platforms probe automotive FlexRay
Yokogawa Electric Corp. announces that it has developed the DL7400 Series FlexRay Signal Analyzers.
2008-01-30 DDR BGA probe debuts for scopes, logic analyzers
Agilent Technologies claims the industry's first DDR2 and DDR3 BGA probes for oscilloscopes and logic analyzers.
2003-02-17 Confidence in high-bandwidth probe measurements
A probe must not disturb the signal under test significantly and must represent the signal at its input accurately; hence, evaluation of the probe configuration must be done in order to measure high-bandwidth signals confidently.
2013-11-18 Checksum, ECT unveil universal-probe test system
The Tilt 12KN claims to deliver in-circuit coverage and increased throughput using Tilt fixturing at a low bed-of-nails tooling cost of about $2 per pin.
2012-06-01 Characterize probe system with PrecisionProbe on Infiniium scopes
Know how to address the loss due to the probing system and its impact on oscilloscope measurements.
2005-04-25 Center probe RF test socket is designed for Delta handlers
Aries introduced a new center probe RF test socket designed specifically for use with Delta handlers.
2002-10-23 Cascade wafer probe provides <0.1 ohm contact resistance
The Infinity Probe on-wafer test device from Cascade Microtech provides <0.1 ohm contact resistance on aluminum pads with >100,000 cycles.
2011-10-12 Cascade Microtech launches multicontact probe device
Cascade Microtech has launched its multicontact quadrant probe InfinityQuad, a device capable of overtemperature probing of 3050?m device pads.
2004-07-30 Canada has launched DRAM competition probe, claims Infineon
The United States subsidiary of German chipmaker Infineon Technologies AG is being investigated for alleged violation of the Canadian Competition Act with regard to the sale of DRAMs, according to a filing made with the United States Securities and Exchange Commission on Monday (July 26, 2004).
2003-03-24 Cameca probe equipment integrates Cimetrix tool
Cameca will utilize Cimetrix Inc.'s CIM300 and CIMConnect in its 300mm shallow probe equipment.
2013-10-23 Automated fibre probe to speed up connector certification
The FIP-400B fibre inspection probe from EXFO claims to simplify the inspection process and speed up connector certification time, securing the network from issues related to damaged connectors.
2015-02-18 atg Luther & Maelzer to unveil flying probe test solution
The A7 - Automation (A7A) features eight high-speed carbon fibre test heads in combination with four high resolution colour cameras, and performs up to 125 measurements per second.
2015-04-02 Atg delivers flying probe tester for substrates
The S3 10?m Substrate Tester from atg Luther & Maelzer enables positioning accuracy and high number of contact points through flying probe technology.
2002-07-23 Applied Precision receives patent for probe card analysis
Applied Precision LLC has received U.S. patent 6,414,477 B1 for the technology embodied in its waferWoRx Probing Process Analysis System.
2012-04-13 Apple/Foxconn probe overhauls electronics mfg
The FLA investigation has revealed serious workers' issues, which warrant increased focus on complianceas well as rising costs for electronics brands.
2005-08-16 Analyzers graphically probe PCI-X
If you're adopting PCI Express v1.1, and (likely) working in a Windows development environment, check out VMETRO's new Vanguard Express family of protocol and link analyzers.
2004-11-05 Agilent spins mixed-signal scope dynamic probe for Xilinx FPGAs
Agilent Technologies is debuting what it says is the industry's first FPGA dynamic probe application.
2004-06-04 Agilent dynamic probe allows FPGA debugging
Agilent introduced what it claims as the industry's first commercially available dynamic probe application for logic analyzer-based debug of FPGAs.
Bloggers Say

Bloggers Say

See what engineers like you are posting on our pages.

Back to Top