Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > Advanced Search > probe

probe Search results

?
?
total search626 articles
2006-04-05 Tool assists in PCB testing and in-system programming
JTAG Technologies announced the introduction of JTAG ProVision, a tool that aims to accelerate and simplify the development of boundary-scan applications.
2008-11-19 Tiny circular connectors suit industrial, military apps
ITT Interconnect Solutions has developed a family of miniature circular connectors with similar electrical and mechanical characteristics to larger, heavier MIL-DTL-38999 connectors.
2005-08-16 Timing analyzer puts ASIC-like functionality in FPGAs
Actel Corp. rolls out a static timing analysis engine that brings ASIC functionality into the FPGA world.
2011-04-13 TI-NSC merger: Winner, blunder or equalizer?
EE Times explains why high-tech acquisitions such as the TI-NSC deal are often less than successful, citing as reasons the acquired company's instability and employee and customer fears during negotiations.
2013-05-21 TI's debuts Cortex-M3 powered Zigbee SoC
The CC2538 is a Zigbee solution with an ARMCortex-M3 MCU that supports IP standards-based development using IEEE 802.15.4 and 6LoWPAN IPv6 networks for maximum flexibility.
2006-08-09 TI kit speeds up ultrasound equipment devt
Texas Instruments released an ultrasound signal chain demonstration kit that speeds time to market and lowers cost by cutting development time for ultrasound equipment.
2005-06-07 Three tout more nimble physical design
Three tool vendors are pitching breakthroughs in IC physical design in advance of next week's Design Automation Conference
2004-11-09 The subsidiary will operate as the China business hub engaging in development, manufacturing, sales and after-sales service of SII NanoTechnology's analysis and measurement instruments.
SII NanoTechnology Inc. has established SII NanoTechnology (Shanghai) Inc.
2014-07-07 The cost of overlooking design-for-test
To prevent costly printed circuit board rework, it is important to have an effective DFT strategy based on a close partnership and working relationship between PCB design and test engineering.
2003-12-01 Testing an A/D's power supply rejection ratio
This article describes an easy way to measure the system's AC power supply rejection and quickly determine how badly the power supplies are corrupting the system dynamics.
2009-11-10 Test suit handles high-volume IP traffic
Tektronix has expanded its test portfolio for communications carriers to meet the increasing amount of data that needs to be monitored, acquired and tested in all-IP communications networks.
2008-03-19 Test solution rolls for DDR2, DDR3 SDRAM
Tektronix has released a comprehensive test tool set for DDR2 and new DDR3 SDRAM technology, developed to deliver higher performance data rates.
2012-03-19 Test sol'ns ease integration of PCIe 3.0 in Intel Xeon processors
Tektronix products that support development of the processors include DPO/DSA/MSO70000 series oscilloscopes, TLA7SA16/TLA7SA08 logic protocol analyzer modules and TLA7000 series logic analyzers.
2007-01-18 Test sockets accept 0.40mm pitch devices
Aries Electronics has announced that all sizes of its CSP/Micro BGA test and burn-in sockets accept devices with pitches as low as 0.40mm.
2005-07-14 Test socket fits 28-40mm? devices
Aries Electronics' new RF socket can be used for manual testing of devices with pitches as small as 0.50mm, in apps with speeds from 1GHz to 18GHz.
2015-04-24 Test module enables process optimisation
The Exensio-Test from PDF Solutions allows IC companies to streamline operations and claims to offer significantly reduced test times through the implementation of real-time adaptive test algorithms.
2010-11-04 Test dev software, PXI, FPGA products launched
Geotest updates ATEasy and launches new PXI digital & FGPA products.
2015-04-14 Test adapter geared for SMARC computer-on-modules
The device from Yamaichi Electronics ensures a perfect alignment of the contacts and allows for 100 per cent contacting reliability up to 50k mechanical cycles.
2005-05-02 Teradyne rolls new test tool
Teradyne announced an advanced vectorless test tool for detecting open pins on components and connectors assembled onto PCBs.
2002-09-03 Teradyne ICT system targets high-volume assembly
Teradyne's Assembly Test Division has made available the TestStation SE ICT system, targeted towards manufacturers of high volume electronics assemblies
2004-12-21 Tektronix, IBM partner on new SiGe chips
A partnership that began in 1996 between Tektronix and IBM Corp. is just beginning to show results with a new generation of SiGe chips for high speed instruments from the test and measurement vendor.
2006-09-26 Tektronix, FS2 develop debug tool for Xilinx FPGAs
Tektronix Inc. and First Silicon Solutions announced the FPGAView software package for Tektronix TLA Series logic analyzers that enables real-time debugging of Xilinx FPGAs.
2012-10-22 Tektronix's oscilloscope offer full serial bus decode
The new oscilloscopes are also well suited for education environments where instructors need to keep the classroom and lab experience consistent with real-world industry trends.
2007-10-11 Tektronix upgrades signal fidelity of oscilloscopes
Tektronix has added enhanced its DPO7000 series and the DPO and DSA70000 series oscilloscopes to provide unimpaired signal representation and accurate timing and amplitude measurements.
2004-09-20 Tektronix industrial power option complements new DSO
Tektronix released its TPS2PBND Power Bundle, an industrial power option to complement the new TPS2000 series of Digital Storage Oscilloscopes.
2004-09-20 Tek's new 4-channel portable scopes take to lab or field
Tektronix's new scopes give users the usual oscilloscope front panel, but with totally independent knobs and buttons for each channel.
2005-08-29 Tek spins scope-like 3-in-1 function generators
The new arbitrary/function generators from Tektronix have big (5.6-inch) menu-display LCDs that look very much like oscilloscope screens.
2010-09-07 Team research to develop lab-on-chip system vs cancer underway
At the EMBC in Argentina, IMEC and its partners launched the European Seventh Framework Project MIRACLE which aims to produce an operational lab-on-chip for the isolation and detection of circulating and disseminated tumor cells in the blood.
2014-06-23 TE expands into high-growth sensor market
TE Connectivity's $1.7 billion acquisition sensor maker Measurement Specialties broadens its range of solutions, increasing its addressable market by nearly $40 billion.
2007-06-15 Systems enable fast, easy semiconductor characterization
Keithley Instruments Inc. announces the availability of the Automated Characterization Suite (ACS) integrated test systems for semiconductor characterization at the device, wafer and cassette level.
Bloggers Say

Bloggers Say

See what engineers like you are posting on our pages.

?
?
Back to Top