Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > Advanced Search > product characterization

product characterization Search results

?
?
total search184 articles
2008-04-15 Pattern generator offers verification, characterization
Byte Paradigm has released the Wave Generator Xpress, a PC-controlled arbitrary digital waveform generator on USB.
2004-05-13 Legend offers process characterization tool
Extending its CharFlo_Memory! characterization software, Legend Design Technology has introduced CharFlo-Memory!-TD
2000-04-12 Characterization report on 622Mbps logic interface laser transmitter for OC12/STM4
This application note describes the characterization work performed on the XMT5170B-622 20 PIN DIP logic interface laser transmitter. The note also evaluates the XMT5170B-622 performance under all conditions against target parameters in the product specification.
2000-01-03 Characterization report on 1.25Gbps 1300nm laser transceiver for IEEE 802.3 Gigabit Ethernet
The HFCT-53D5 family of transceivers are high performance modules for serial optical data communications applications specified for signal rates of up to 1.25Gbps. The HFCT-53D5 is designed to provide an IEEE 802.3 compliant link for intermediate reach Gigabit Ethernet applications. This application note details the characterization work performed on the HFCT-53D5 Duplex Transceiver. It also evaluates the HFCT-53D5 performance under all conditions against target parameters in the product specification.
2003-02-07 Catalyst sets up product development center in Europe
Catalyst Semiconductor Inc. has launched its first international product development center in Bucharest, Romania
2012-06-28 Optimize thermocouple measurements in hostile environment
Learn how to make good measurements in a hostile, noisy environment, especially when the voltages you are measuring are small.
2009-03-25 LED design goes interactive
Cree Inc. launched the Product Characterization Tool (PCT), an interactive LED design tool that simplifies the task of translating nominal LED performance to real-world conditions.
2002-09-06 Tektronix analysis package has frequency-mask triggering
The WCA11A signal analysis software package from Tektronix Inc. provides fault finding features and test automation to the company's WCA380 wireless communication analyzer.
2006-08-16 Statistical timing revs for 45nm era
Statistical-timing analysis may represent the next major technology shift in nanometer IC implementation, but it's going nowhere fast without statistical-timing models.
2003-05-30 Spirox to distribute LogicVision products
Taiwan-based Spirox Corp. has been appointed by LogicVision Inc., a provider of embedded tests for ICs, as its exclusive distributor for the latter's products in Taiwan, mainland China, and Singapore.
2003-08-12 Silicon Metrics wins key patent
Silicon Metrics Corp. has won a U.S. patent on some of the core technology used in its EDA characterization and modeling software
2003-02-20 Silicon Metrics appoints NewPlus as distributor in China
NewPlus Systems & Technologies Ltd of Shanghai, China has been selected to represent Silicon Metrics Corp. in China's semiconductor design and fabrication industry.
2007-05-29 On-wafer solution brings power devices to market faster
Cascade Microtech's Tesla system touts a complete on-wafer solution for overtemperature, low contact resistance measurements of power semiconductors of up to 60A (current in pulsed mode) and 3,000V (coaxial measurement).
2007-12-07 ON Semi opens IC protection test lab in China
ON Semi has opened a Circuit Protection Applications Test Laboratory in Shanghai, China to support its APAC customers.
2002-12-09 Northrop adopts Credence debugging system
Northrop Grumman Corp.'s Electronic Systems sector has selected Credence Systems Corp.'s IMS Vanguard test system for debugging, characterization, and failure analysis of complex devices
2007-06-01 Library Compiler supports CCS models
Seeking to drive wider adoption of its Composite Current Source models, Synopsys Inc. updated Library Compiler, a library modeling tool used by virtually every Synopsys user.
2007-09-19 Instruments advance chip test productivity
Keithley Instrumnets has expanded its product line for semiconductor characterization and production tests.
2002-12-12 Flextronics starts Mexico tech center operations
Flextronics Corp. has opened its Technology Center in Guadalajara, Mexico.
2011-06-16 Corning opens design hub in Taiwan
The center will be Corning's applications engineering and design hub in Asia, which will focus on product development of consumer electronics
2003-09-04 Circuit Semantics lands additional venture funding
Digital cell characterization tool vendor Circuit Semantics has closed a third round of funding, gaining $1.6M from VenGlobal and Crescent Ventures
2006-10-02 Agilent touts 'first' PSP model extraction package
The PSP model parameter extraction package from Agilent provides more accurate and efficient modeling than was possible with previously available solutions.
2013-12-20 E-waste to top 65.4M tonnes yearly by 2017
The report is based on data compiled by Solving the E-Waste Problem (StEP) Initiative that shows a global increase of 33 per cent in only five years.
2010-09-22 “Reality? project characterizes ARM926 for inherent variability at 32nm
An IMEC-led project, called “Reality?, has conducted a characterization of an ARM926 core for the statistical variability that is inherent at the 32nm manufacturing process node. The research project, set up in 2008, has cost about $5.8 million
2002-09-12 Tritech to represent Silicon Metrics in South Korea
Silicon Metrics Corp. has signed Tritech Systems Inc. to represent its entire SiliconSmart product line in South Korea
2002-06-14 Tower Semi adopts Celestry analog device models
Tower Semiconductor Ltd has selected Celestry Design Technologies Inc.'s device-model parameter extraction products and characterization services for its 0.185m process and Fab-2 technologies
2007-05-31 Tool tackles power integrity issues in ICs, packages, boards
Aiming to deliver a comprehensive solution for tackling noise and power at the chip, I/O and PCB design levels, Apache Design Solutions announced its Sentinel product line
2003-06-02 Tool analyzes power dynamically, at cell level
Apache launched its 2nd product designed for power analysis, the RedHawk-SDL
2007-05-14 Test software enables enterprise-wide collaboration
VI Technology Inc.'s Arendar 2007 test platform expands on the highly-configurable and expandable Arendar platform to provide instant access to design, characterization, validation and verification, and manufacturing test information across the enterprise
2008-02-08 Scope breaks 1Gpt memory barrier
Agilent Technologies said its Infiniium 90000A product has broken the one-billion acquisition samples (1Gpt) barrier for the first time in a high-performance oscilloscope
2010-08-02 PV measurement tools promise consistency
Konica Minolta Sensing Americas Inc. launches a full line of photovoltaic measurement and characterization instruments that feature a reference cell as a standard point of calibration
Bloggers Say

Bloggers Say

See what engineers like you are posting on our pages.

?
?
Back to Top