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2005-04-26 Test suite checks VoIP-over-WLANs
VeriWave's VoIP-over-WLAN Analysis Test Suite assesses voice-quality metrics of realworld VoIP over WLAN networks.
2010-11-04 Mentor Graphics, ARM team up for memory test
Mentor's Tessent memory test and repair solution now supports ARM's memory BIST bus and interface that provides external access to all memories contained within the processor core
2016-01-05 Enhance test quality, minimise DFT costs
Learn about two test solutions that can be implemented to exploit additional advantages of hybrid silicon test solution
2010-05-26 WLAN test solution validates actual network traffic
VeriWave's WaveDeploy WLAN site assessment solution analyzes network readiness, real performance and the impact of growth and change, with a single pass through a facility
2011-09-22 Wireless communications to boost test market
The proliferation of mobile devices and wireless networks raises the demand for wireless test solutions
2005-03-18 Wafer tester monitors RF chip quality in realtime
Keithley Instruments is now introducing a third-generation on-wafer RF measurement capability with some very promising features that address the conundrum.
2004-05-06 VeriWave fields test system for WLANs
VeriWave has introduced hardware and software that tests WLAN conformance and reliability at all stages of system development
2011-08-25 Upgraded PXI platform cuts test times, costs
NI has expanded the capabilities of its PXI platform for semiconductor characterization and production test with new per-pin parametric measurement unit modules and source measure unit modules
2005-08-17 Tuner improves reception of free-to-air satellite signals
The team at Zarlink has integrated an external LNA into the receiver chip in the ZL10039, making it possible for STB designers to put a Free-to-Air tuner with the required sensitivity right on the motherboard.
2013-06-19 TrueSTUDIO v4.1 bolsters embedded test support
Atollic's TrueSTUDIO v4.1 includes the ability to record and display instruction trace data, aiding embedded developers maintain software quality
2004-02-02 Toolset eyes process test-chip design
Silicon Canvas released a platform for process test-chip development that is designed to help foundries create test chips to verify, optimize and calibrate silicon processes
2005-06-03 The basics of network processors
Here's a snapshot of the state of the NPU art, outlining what makes a network processor and what features are likely to become most popular
2007-10-30 Test tool 'first' to validate IPTV QoE on IPv6 nets
Agilent Technologies claims its N2X multiservices test solution is the industry's first test solution for validating IPTV service quality for thousands of subscribers on IPv6 network architectures.
2015-04-24 Test module enables process optimisation
The Exensio-Test from PDF Solutions allows IC companies to streamline operations and claims to offer significantly reduced test times through the implementation of real-time adaptive test algorithms
2011-08-01 Test kit for Android enables enhanced user experience
Wind River's Android test development kit validates device user experience by reproducing human interactions to test user interfaces
2005-01-03 Test experts ponder cost of defects
Is 100 DPPM too tough to be practical for designs in 100nm or finer processes?
2010-11-04 Test coverage analysis tool features yield estimation
ASTER's TestWay Express now allows estimates for new product yields
2010-01-14 Test aims for standards flexibility combined with precision
Rohde & Schwarz's Erich Freund highlights changing requirements, particularly in communications--WiMAX, LTE, Wireless HD--and says test equipment must be flexible without sacrificing precision
2015-11-20 Test active optical cables during design, production
Testing and analysis done at critical junctures during the design process can further reduce costs by optimising the design for high yield given specified manufacturing tolerances.
2004-10-04 Tektronix unveils new test suite version for K15 platform
The new version of Tektronix's software test suite for its K15 platform promises to provide enhanced productivity when testing 3G, 2G and 2.5G mobile services
2004-06-17 Tektronix adds HSDPA test capability to WCA
Tektronix added the High Speed Downlink Packet Access test capability to its series of Wireless Communications Analyzers
2007-11-01 Step up handset test with adaptive test case
Developers can significantly simplify handset testing by zeroing on the development of reusable test logic that can be used with automated testing platforms. An adaptive test case methodology boosts test case development and enables reuse of test IP across test cases, handset platforms and OS
2010-04-06 Starter kit tests FPGA transceiver signal quality
Altera releases the Cyclone IV GX-based Transceiver Starter Kit, which features an EP4CGX15 FPGA with approximately 15K logic elements, 540Kbit of RAM and two integrated 2.5Gbit/s transceivers
2012-10-24 Start-up focuses on data overload in silicon mfg and test
Qualtera's Silicondash is an automated decision support system for semiconductor test data analysis that runs in a choice of secure data centres
2008-09-03 Spectra2 enhancements highlight core network test capabilities
Tektronix Communications introduces the Spectra2 6.3 Core Network Test Solution software release, which offers comprehensive testing for IMS and TISPAN networks
2004-11-03 Software promises realtime test, product quality, performance insight
SigmaQuest is rolling out a new product that provides actionable information that can help ensure product intergrity and process integrity.
2000-12-01 SoCs likely to pose heading-off test problems
This technology news article describes the problems and solutions test engineers should face when confronting SoC designs
2009-05-27 Signal generator geared for TV quality testing
Rohde & Schwarz has introduced the R&S DVSG (digital video signal generator) that supports the development and quality assurance of latest TV sets and projectors
2014-11-11 Shifting to requirements-driven verification, test
Here is an evaluation of the pros, cons and potential obstacles to requirements-driven verification and test so you may decide if it is the next step in evolution
2002-07-02 Rohde & Schwarz multiport test system fits stress test apps
Rohde & Schwarz is offering the PJB multiport test system, which enables network operators and component manufacturers to test stress in system integration applications
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