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2016-05-05 Scanning electron microscope offers resolution down to 1nm
The Apreo SEM from FEI is capable of resolution down to 1nm at 1kV without the need for beam deceleration, providing high performance on nearly any sample, even if it is tilted or topographic.
2006-12-05 New microscope enables atomic-scale wafer analysis
FEI will unveil a family of transmission electron microscopes (TEM) that it says will enable atomic-scale imaging and analysis of semiconductor wafers
2013-01-29 Low voltage scanning electron microscopy films
Here are examples where Agilent 8500 FE-SEM provides high resolution images of sensitive organic and biological samples.
2013-07-16 Understanding electron pairing in magnetic semiconductors
Researchers measured the energy required for electrons to pair up and how that energy varies with direction, and identified the factors needed for magnetically mediated superconductivity.
2012-08-01 Verios SEM boasts precise measurements at 22nm or below
System delivers powerful resolution and contrast for precise measurement of sensitive materials in semiconductor and materials science applications.
2012-03-13 Using FE-SEM in MEMS analysis
Learn about the Agilent 8500 compact FE-SEM, a low voltage, field emission SEM which employs an electrostatic lens design.
2001-09-12 Surface characterization of semiconductor materials by AFM
This application note presents a comparison of roughness measurements by AFM (Atomic Force Microscope) and SEM (Scanning Electron Microscope) of silicon substrates bombarded and analyzed during SIMS (Secondary Ion Mass Spectrometry) experiments.
2002-12-20 Stanford advanced nano facility to house FEI systems
Stanford University has established an advanced nanocharacterization facility in collaboration with FEI Co.
2010-08-05 SEM offers high beam current, low vacuum capability
The series of ultra-high resolution scanning electron microscopes are designed to provide nanometer-scale resolution and ultra-precise analysis on a wide range of samples
2002-12-26 Nanoimprint lithography ready to make its mark
A potentially low-cost form of lithography affectionately known as
2012-01-26 Learn about stereomicroscopy
Read about the demonstration of qualitative stereo imaging on Agilent 8500 compact field emission scanning electron microscope.
2005-06-10 Intel tips high-speed 3D imaging for SEMs
Intel Corp. is developing a scanning electron microscope (SEM) technology that claims to be 100,000 times faster than current systems in the marketplace
2013-02-06 Imaging organic, biological materials with SEM
Learn how to facilitate imaging of organic and biological materials using Agilent 8500 low voltage scanning electron microscope.
2012-11-27 Georgia Tech researchers advance graphitic nanojoints
A team of researchers from the Georgia Institute of Technology used a technique based on electron beam-induced deposition to develop the graphitic nanojoints
2004-12-10 CD-SEM offers measurement throughput as high as 1,000 sites/hour
Soluris, a manufacturer of CD-SEMs for advanced semiconductor manufacturing, announced its new Yosemite SP-1000.
2015-08-28 EUV reaches angstrom resolution
The angstrom-level resolution of a new type of microscope uses femtosecond pulses of extreme ultraviolet light (EUV), the same wavelength light to be used for sub-10nm semiconductor lithography
2013-08-19 Auger chemical state analysis for leadframe issues
Read about the use of Auger Electron Spectroscopy chemical state analysis to evaluate the wirebond non-stick on leadframe issue
2010-09-27 What happens when you try to store data on a single iron atom?
Physicists at the IBM Almaden Research Center perfected a new pump-probe pulsed-STM technique that may pave the way to enabling single-atom bit-cells for memory ICs.
2016-04-11 Probing ReRAMs: Forming scaling, quantised conductance
Learn about the new ReRAM challenges as an IMEC team have formed and characterised the electrical conductance and topology of some of the smallest ReRAM filaments ever reported.
2002-10-17 Polymers self-assemble to form 2.5nm diode
A diode measuring 2.5nm was recently demonstrated by a University of Chicago professor Luping Yu, who called it the world's smallest semiconductor device.
2005-07-18 Organic molecule switches like a transistor
University researchers have successfully demonstrated a single-molecule switch and transistor.
2001-09-12 AFM: A complimentary technique for SEM investigation
This application note explains the advantages of using AFM (Atomic Force Microscopy) over SEM (Scanning Electron Microscopy) in preventing surface contamination during routine imaging
2007-02-01 Next-gen memory market up for grabs
The frantic search for a next-generation memory technology took center stage at the IEEE International Electron Devices Meeting in December, amid growing concerns that DRAM and flash parts will no longer scale in the near future
2011-04-01 Metrology tool boasts improved modeling capability
The Spectrashape dimensional metrology systems released by KLA-Tencor features AcuShape2 modeling software developed jointly with Tokyo Electron Limited
2014-08-08 Spin-polarised probing visually renders magnetism
Researchers used a spin-polarised scanning tunnelling microscope for atomic-scale imaging of magnetic structuresexpected to reveal new aspects of high-temperature superconductivity
2012-12-11 Waveguide enables 3D focusing of light
Caltech engineers have created a modified light-focusing device that may lead to applications in computing, communications, and imaging.
2007-05-15 Visible LED Lab solution evaluates LED specs
TT electronics Optek Technology's in-house visible LED laboratory features an array of equipment and other resources to accurately assess products ranging from single LEDs to complex power LED assemblies.
2014-04-24 Ultracapacitors get storage boost from graphene, nanotubes
George Washington University researchers combined graphene flakes with single-walled carbon nanotubes to develop an ultracapacitor that boasts a capacitance value three times higher than that of a device made from carbon nanotubes alone.
2007-04-19 Synopsys, NGR team on faster OPC model at 45nm
Synopsys and NanoGeometry Research announced they have partnered to enable faster, more accurate, more predictive optical proximity correction (OPC) model-building at 45nm and beyond.
2013-05-09 Synchronised technique for next-gen data storage
The BPMR technique offers much higher storage capacity because it records the data in a regular array of single-grain magnetic islands that can be much smaller than multiple grain bits in continuous media.
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