Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > Advanced Search > semiconductor test

semiconductor test Search results

total search1902 articles
2004-03-18 Vimicro selects Teradyne J750 for audio processor test
China-based chip solution provider Vimicro Corp. will use Teradyne Inc.'s J750 MSO system to test a new audio processor device designed to provide high-quality music ring tones and game sounds for mobile phones
2004-02-02 Vectorless test: Best bet for high-speed I/O
An approach called vectorless test is emerging that offers the best of both approaches: the cost effectiveness of on-chip I/O BIST combined with ATE-based signal integrity measurements
2011-08-25 Upgraded PXI platform cuts test times, costs
NI has expanded the capabilities of its PXI platform for semiconductor characterization and production test with new per-pin parametric measurement unit modules and source measure unit modules.
2001-06-14 Testing Teccor semiconductor devices using curve tracers
This application note discusses the testing procedures for Teccor Electronics' semiconductor devices (such as rectifiers, SCRs, etc.) using Tektronix's curve tracers
2004-04-21 Test consortium expands to China
The Semiconductor Test Consortium has signed an agreement with the China Beijing Semiconductor Industry Association (CBSIA) to collaborate on individual and joint activities aimed at promoting the consortium's charter and deployment of its Open Architecture test initiative in China.
2005-03-17 Teradyne supplies RFID test systems to J750 systems
Teradyne Inc. disclosed that Beijing Huada, a VLSI testing service and solution provider for Beijing and Northern China, has purchased multiple J750 test systems to meet production capacity for RFID smart card testing
2004-01-07 STATS purchases multiple Agilent SoC test systems
ST Assembly Test Services Ltd (STATS) has purchased multiple Agilent 93000 CMOS Image Sensor systems by Agilent Technologies Inc
2012-10-24 Start-up focuses on data overload in silicon mfg and test
Qualtera's Silicondash is an automated decision support system for semiconductor test data analysis that runs in a choice of secure data centres.
2006-09-01 Solving the MCP memory test challenge
Multichip packages (MCPs) are the standard for cellphones, with nearly all modern cellphones having at least one MCP. Using MCPs allows manufacturers to offer the new multifunction devices while maintaining small form factors.
2010-09-14 SoC test platform integrates customizable modular solutions
Advantest integrates OptimalTest's solutions in semiconductor test equipment
2005-04-08 Semiconductor analyzer packs integrated CV, IV capability
Agilent is introducing a Windows-based semiconductor device analyzer that integrates CV and IV measurements into a single instrument
2006-08-07 Philips sells semiconductor unit
Royal Philips Electronics has divested and sold a majority stake in its semiconductor business to a trio of equity firms: KKR, Silver Lake Partners and AlpInvest Partners
2004-02-02 Open architecture ATE tackles test woes
The basic idea behind the open architecture test system is to provide such modularization with specific focus on the use of third-party modules and test instruments
2003-04-25 NPI buys out semiconductor test provider from Kobe Steel
Kobe Steel Ltd has agreed to transfer 65 percent of the outstanding shares of its wholly owned subsidiary Genesis Technology Inc. to GTI Holdings Inc.
2008-10-30 New IC test group consolidates ATE standards
Advantest, Amkor, Infineon, Intel, LTX-Credence, Qualcomm, Roos Instruments, Teradyne, and Verigy have collaborated under a new group to foster precompetitive partnership and standards in automatic test equipment
2005-03-16 Modular scalable test set comprises source-measure ATE
When you consider that a dual-channel Model 2602 SourceMeter sells for less than $8,000, that seems like a pretty good deal that's worth investigating further.
2014-12-22 Marvin offers compact, cost-effective test platform
The TS-960 features a 20-slot, 3U PXI chassis accommodating up to 512 125MHz digital I/O channels with PMUs per pin, allowing users to address a range of test applications
2003-05-27 LTX to acquire semiconductor development company
LTX Corp. has entered into a definitive agreement to acquire StepTech Inc., a company specializing in ATE instrumentation of wireless apps.
2008-01-16 Keithley updates ACS test software
Keithley Instruments' updated Automated Characterization Suite V3.2 software enhances the powerful automation capabilities of ACS integrated test systems
2006-08-25 JFET op-amp targets semiconductor test apps
NEC Electronics has rolled out PC835, a JFET-class dual operational amplifier for IC test applications
2003-07-03 ISPL acquires semiconductor test and assembly firm
Infiniti Solutions Pte Ltd (ISPL), a Singapore-based provider of semiconductor test and assembly services, has acquired Automated Technology Inc. (ATEC).
2002-10-22 ISE Labs, MuAnalysis to provide test platforms in Canada
ISE Labs Inc. and MuAnalysis Inc. have signed an agreement to combine the latter's analytical expertise with ISE's testing capabilities in order to provide comprehensive analytical IC testing services to the Canadian semiconductor industry
2009-10-09 ISE Labs expands test capabilities
The largest semiconductor test provider in Silicon Valley will use Verigy's V93000 High Speed Memory system.
2002-07-24 Intel, Advantest back open test platform
Advantest Corp. is spearheading an effort to create an industrywide platform for IC test that addresses the often rocky relationship between chip suppliers and ATE providers
2012-09-05 Fujitsu Semi transfers test, assembly plants to J-Devices
Fujitsu Semiconductor will close one of its test and assembly plants while also transferring two other plants to J-Devices.
2005-03-23 Freescale Semiconductor opens test center in Japan
Freescale Semiconductor has opened a test and quality center in Nagoya, Japan to support automotive manufacturers located there.
2012-09-05 FormFactor to buy SoC wafer test firm
FormFactor signed a merger agreement with Astria Semiconductor to acquire MicroProbe for $100 million in cash and $16.8 million in stock
2004-01-06 FastRamp changes name to STATS FastRamp Test Services
ST Assembly Test Services Ltd (STATS) announced that FastRamp Test Services Inc. has changed its name to STATS FastRamp Test Services
2007-10-22 Consortium drafts IC test interface extension standard
The Semiconductor Test Consortium Inc. has published the first draft of terminology specifications for the Semiconductor Test Interface eXtensions (STIX) initiative.
2015-04-27 Configurable test systems reduce testing cost
The STS series from NI is a line of configurable test systems geared to lower the costs of semiconductor production test and lab characterisation.
Bloggers Say

Bloggers Say

See what engineers like you are posting on our pages.

Back to Top