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2003-06-30 Cirrus Logic sells test assets to ChipPAC
Cirrus Logic Inc. has agreed to sell its semiconductor test operations assets in Austin, Texas, to ChipPAC Inc.
2003-07-21 Chip test consortium releases second Openstar spec
The Semiconductor Test Consortium announced that they have released the second draft of the specification for Openstar.
2006-10-30 Cadence, Source III partner for improved test validation
Cadence Design Systems Inc. and Source III Inc. entered a collaboration to enable improved test validation and faster test conversion for enhanced chip quality
2002-06-27 BridgePoint, Credence to establish test technology center
BridgePoint Technical and Credence Systems have partnered to establish a test technology center aimed at providing semiconductor companies with access to the test solutions, training and resources needed to evaluate and rapidly develop semiconductor test solutions.
2005-10-12 Amkor spin-off Integra focuses on test
Integra Technologies LLC, once part of Amkor Technology Inc., on Monday (Oct. 10) announced the commencement of its operations in the chip-testing sector.
2006-12-08 Agilent allies with CWS for test solutions
Agilent announced a formal agreement with Core Wafer Systems, a provider of accelerated and long-term reliability test solutions and analysis tools for the semiconductor test market space.
2006-10-05 Agilent adds test option to accelerate yield ramp-up phase
Agilent announced a new parametric test option that claims to accelerate the yield ramp-up phase for IC makers
2006-03-20 Agilent 93000 selected by Infineon to test comm devices
Agilent Technologies announced that it supplies its 93000 Pin Scale system to Infineon Technologies to conduct high-speed digital and mixed-signal application tests.
2005-06-14 Aehr Test rolls out new wafer tester
Aehr Test's new FOX-1 full wafer contact test and burn-in system is focused on testing an entire wafer of devices with a single touchdown or for short-duration burn-in and test
2004-03-30 Aehr supplies Fuji Xerox with wafer test system
Aehr Test Systems, a supplier of semiconductor test and burn-in equipment, has delivered Fuji Xerox Co. Ltd with a FOX full wafer contact test and burn-in system.
2002-07-22 Advantest to form consortium promoting open test architecture
Advantest Corp. has announced its plans to establish the Semiconductor Test Consortium, an industry-wide collaboration aimed at solving the challenges of cost-effective testing complex logic devices such as SoCs.
2005-06-20 Advantest rolls new test solutions
Advantest unveiled its latest memory tester, the T5588, and new dynamic test handler, the M6300
2003-06-18 Winstek installs Agilent SoC test systems
Winstek Semiconductor Corp. has purchased and installed 15 of Agilent Technologies Inc.'s 93000 SOC Series test systems.
2007-07-19 WiMAX test system revs up production throughput
Agilent Technologies Inc. and GCT Semiconductor Inc. have partnered to jointly implement a WiMAX manufacturing test system for GCT's WiMAX chipsets.
2005-09-12 Why Class D amplifiers may test well but often sound terrible
Class D amplifiers are fundamentally different from analog amplifiers, not only in their circuitry, but more importantly in the way they operate
2010-09-21 VOICE 2011 Forum on Semiconductor Testing Technologies call for papers
The VOICE 2011 Forum on Semiconductor Testing Technologies is now accepting papers from the international community
2006-11-01 Verify macro model accuracy with PSpice test circuits
Instead of investigating op-amp macro models' shortcomings, it would be wiser to have a collection of circuits that allows users to test any model
2013-10-11 TU Delft, Imec co-author test flow for 3D IC optimisation
3D-COSTAR aims to optimise the test flow of 3D stacked ICs by compiling the yields and costs of design, manufacturing packaging and logistics
2003-04-23 TSMC will expand test, assembly services to spur demand
In an effort to remove barriers to chip production, Taiwan Semiconductor Mfg Co. will announce an expansion of its test and assembly services and additional guidance for chipmakers on how to prevent manufacturing delays.
2002-08-22 Tower Semiconductor adopts PDF Solution technology
PDF Solutions Inc. has partnered with Tower Semiconductor Ltd on a program to enhance the yield and performance of 0.185m CMOS process technology at Tower's Fab 2
2003-09-15 Toshiba deploys Keithley IC test system
Toshiba Corp. has selected Keithley Instruments' S630DC/RF parametric test system to support production of its new generation of semiconductors
2009-04-23 TI ramps production in Philippine test plant
Texas Instruments Inc.'s new assembly/test facility within the Clark Freeport Zone in the Philippines is now fully operational and ramping production with the latest packaging technologies
2007-05-07 TI expands Philippine test operations with new site
Texas Instruments announced plans to expand its assembly/test operations in the Philippines with a new site that aims to be the most environmentally efficient assembly/test site in the world
2016-03-09 Thailand semiconductor to tap into $280B car electronics space
Constituting a nearly $100 billion industry, Thailand's E&E sector has played a vital role in growing the country's economy and positioning Thailand as one of the semiconductor leaders in Southeast Asia
2011-07-12 Test system targets 3D, 28nm node ICs
Verigy has released a new generation of test systems for advanced semiconductor designs, including 3D device architecture and IC designs for 28nm technology node and beyond.
2006-11-06 Test suite streamlines Wi-Fi certification process
Azimuth's new AzCert Wi-Fi Certification Test Suite for Wi-Fi Alliance Test Engine-enabled devices is expected to streamline the certification process for a broad range of products with embedded Wi-Fi connectivity
2006-06-27 Test solution measures battery life of mobile apps
Azimuth has announced a test solution that accurately measures power consumption of mobile platforms
2014-03-13 Test sol'ns from Advantest target wireless mobile devices
The 32-port WLS32-A module and the 16-port WLS16-A module use vector signal generation and vector signal analysis software to meet the modulation issues presented by current advanced portable devices.
2011-05-24 Test results exceed specs for new oscilloscope platform
A test done for ASICs designed in IBM's 8HP silicon germanium (SiGe) BiCMOS Specialty Foundry technology has shown promising results for a new oscilloscope platform of Tektronix Inc
2015-12-21 Test power ICs to withstand radiation
Failure in space is to be avoided at all costs because there is no human around to make repairs. Testing can help assure that the ICs will withstand radiation.
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