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2006-03-16 Rx: New test techniques
New measurement approaches require faster and more efficient and reliable instrumentation and software.
2001-03-27 RoboClock II TEST mode
This application note describes the TEST mode feature of Cypress Semiconductor's family of Programmable Skew Clock Buffers (PSCB).
2001-03-27 RoboClock family test mode
This application note discusses the Test mode capabilities of the RoboClock clock buffers. It begins with an introduction to these devices and then discusses how to use the Test mode features
2004-12-14 RFMD deploys LTX test system for volume testing
RF Micro Devices (RFMD) has deployed LTX Corp.'s Fusion CX test system for volume production testing of numerous RFMD semiconductor solutions, including its POLARIS TOTAL RADIO transceivers and its WLAN products.
2014-10-13 RF probes offer mechanical reliability for semicon test
The Z1 boasts an insertion loss of about 30Ghz at -1dB, while Z0 is ECT's ultra-high bandwidth series featuring 1.5mm test height of and 0.60nH of inductance that touts an insertion loss of 40Ghz at -1dB
2011-06-29 Renesas closes assembly, test division
After examining the trajectory of the Tokyo Device Division within the overall back-end production policy of the company, Renesas has decided to close down its operations.
2006-07-17 Re-engineering the obsolete semiconductor
What are the key considerations when looking for a partner to produce obsolete parts for your mission-critical application? John O'Boyle discusses the do's and don'ts that can help make the right moves in re-engineering the obsolete semiconductor
2008-11-04 Qualcomm establishes APAC test center in Singapore
Qualcomm Inc. has opened of its Asia Pacific Test Center of Excellence in Singapore, its first test development center outside of the United States
2014-08-22 PXI test systems bring time-to-market, test cost advantages
The PXI market is expected to rake in $1.75 billion revenues by 2020, driven by an uptake in RF wireless communications where firms turn to PXI-based platforms to reduce costs and time to market.
2008-10-01 PulseCore favors Tektronix USB serial test suite
PulseCore Semiconductor has selected a full suite of Tektronix Inc. test instrumentation to test and validate its recently announced USB 2.0 IC.
2004-01-19 PSi to provide Philips with assembly, test services
PSi Technologies Inc. has signed a long-term supply agreement with Royal Philips Electronics to provide outsourced power semiconductor assembly and test services in China.
2006-11-28 Private equity eyes Taiwan test house
Private equity firm Carlyle Group is making a move to acquire Advanced Semiconductor Engineering Inc., a Taiwan test and assembly house, for $5.46 billion.
2002-10-16 Passing the SoC test with flying colors
The key concern of product developers, SoC design houses and wafer fabs is to provide higher performance and functionalities of SoC at the lowest cost.
2006-02-09 Panasonic to expand assembly, test capacity in Singapore
Matsushita Electric announced that it will invest approximately $85 million for a new building and cutting-edge equipment to expand its semiconductor assembly and test capacity in Singapore.
2002-11-25 Optonics devices chosen to test Motorola devices
Motorola Inc. has adopted Optonics Inc.'s EmiScope-I diagnostic solution for node level timing measurement of its advanced devices.
2006-11-29 OptimalTest promises better yields through test management
OptimalTest has launched what it touts as the optimal test software suite for maximizing IC yields through managed test results
2016-05-10 ON Semiconductor VP shares supply chain ops challenges, solutions
In this interview, ON Semiconductor's Brent Wilson, senior VP of Global Supply Chain Operations and Procurement, talks about how the company is using technology to tackle business challenges and evolve the company's supply chain strategy
2003-11-24 ON Semi to consolidate assembly, test operations
ON Semiconductor has decided to consolidate more of its assembly and test operations at its site in Seremban, Malaysia.
2007-12-07 ON Semi opens IC protection test lab in China
ON Semi has opened a Circuit Protection Applications Test Laboratory in Shanghai, China to support its APAC customers
2010-06-10 ON Semi China test JV plans $30M expansion
ON Semiconductor Inc.'s joint IC-assembly and test venture in China outlined its roadmap and expansion plans amid growing but choppy demand for the U.S. chipmaker.
2008-03-13 NXP transceivers first to comply with FlexRay PHY test
NXP Semiconductors claims its TJA1080A chip has passed the FlexRay PHY Conformance Test, the industry standard for FlexRay products, making it the first transceiver to comply with this test
2010-10-18 NXP to test ATOP-based automotive telematics system in Singapore
NXP Semiconductors building 3.5G automotive-qualified telematics solution for traffic management
2011-01-27 Nujira to unveil second-gen handset test chip
Nujira is announcing its second-generation handset test chip at Mobile World Congress (MWC) in Barcelona next month and the completion of an Envelope Tracking Processor IC for cellular network infrastructure
2000-03-25 Non-contact test access for Surface Mount Technology IEEE 1149.1-1990
Mechanical and chemical process challenges initially limited acceptance of surface-mount technology (SMT). As those challenges have been overcome, another obstacle has become apparent: electronic test access. Through-hole components on a 100mil grid have allowed physical access. SMT, which has provided new levels of packing density has also denied physical test access. To overcome this challenge, the Institute of Electrical and Electronics Engineers (IEEE) has sponsored a new standard, IEEE 1149.1-1990, the Standard Test Access Port and Boundary-Scan Architecture. This application note describes that standard by citing examples of the process
2011-07-21 NI acquires AWR, bolsters RF test portfolio
National Instruments has completed its acquisition of AWR. This will allow the integration of both companies' design and testing software to help reduce time-to-market for RF designs.
2001-04-15 New thinking needed amid runaway test costs
There is a need to achieve test-cost reductions that rival the reductions in wafer fabrication costs to ensure continued growth of semiconductor markets. ATE should not wait for someone else to do it.
2012-06-21 NEC, Advantest team up to develop RFID test sol'n
The collaboration between Hua Hong NEC and Advantest aims to improve RFID test standards by increasing number of RFID parallel sites being tested
2003-06-06 NEC semiconductor package <1mm thick
NEC Corp. and NEC Electronics Ltd. announced that they have developed a MLTS as well as a semiconductor package to support it
2008-10-27 National Semiconductor beefs up analog portfolio
National Semiconductor unveils a series of innovative, energy-efficient automotive products that enable emerging applications in LED lighting, powertrain, safety and infotainment systems
2005-07-15 National Semi to shut down Singapore assembly, test plant
National Semiconductor Corp. plans to close its assembly and test plant in Toa Payoh, Singapore.
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