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2014-12-15 Renesas touts soft error-free, low-power SRAM devices
The RMLV08 adds five products in its line-up that boast a density of 8Mb and use a fine fabrication process technology with a circuit linewidth of 110nm.
2004-06-22 Renesas proofs SRAM cell against soft errors
Renesas developed an SRAM memory cell it claims can reduce soft error rates while reducing cell size and power consumption compared with previous Renesas products.
2009-05-25 LatticeECP3 soft error detection (SED) usage guide
Soft errors occur when high-energy charged particles alter the stored charge in a memory cell in an electronic circuit. This application note describes the hardware based soft error detect (SED) approach taken by Lattice Semiconductor for LatticeECP3 FPGAs.
2004-10-08 iRoC offers free web-based tool to assess soft errors
iRoC Technologies has introduced a web-based tool that assesses the soft-error risk of chip designs.
2008-05-05 Fujitsu reports advance in 'soft error' estimation
Researchers at Fujitsu Laboratories in Japan are claiming a major advance on improving the reliability of semiconductors with a technique for quick and accurate measurement of the 'soft errors' that could be caused to a chip by the effect of neutrons from some cosmic rays
2004-12-21 Fujitsu develops soft-error simulator
Fujitsu has developed soft-error simulator software with a margin for error of less than 15 percent compared to soft errors generated by a neutron white beam source.
2002-08-20 EMS ESRAM improves soft-error performance
Enhanced Memory Systems Inc.'s 72Mb NoBL Burst ESRAM is claimed by the company to be the highest-density SRAM replacement product available.
2015-05-28 36Mb synchronous SRAMs flaunt on-chip error-correcting code
The devices from Cypress claim to deliver the highest levels of data reliability, simplifying designs for various military, communication and data processing applications.
2005-03-07 LeCroy unveils new error injector, traffic modification tool
LeCroy introduced an error injector and traffic modification tool that allows technicians to verify real-world fault-handling for Serial Attached SCSI and Serial ATA systems
2015-12-23 Grasp soft-decoding in SSD controllers
In this article, we will take a look at what happens when that initial decode fails and how soft data can be used to recover data on the SSD
2009-05-20 DC/DC converters pack 258MHz voltage-error amp
From Maxim Integrated Products come the MAX15038/MAX15039, small, synchronous DC/DC converters that deliver up to 4A and 6A of output current, respectively.
2002-09-19 National Semiconductor licenses MoSys memory technology
National Semiconductor has licensed MoSys Inc.'s 1T-SRAM embedded memory technology to enable the incorporation of National's memory blocks into their future cellular baseband SoCs.
2010-11-05 IP reduces embedded memory transient errors
Synopsys announced the availability of the DesignWare Self-Test and Repair Error Correcting Codes IP as a part of its DesignWare STAR Memory System product family. This new IP offers a highly automated design implementation and test diagnostic flow which assists SoC designers to rapidly reduce the number of embedded memory transient errors
2007-01-01 Do timely testing to avoid cosmic ray damage
Modern memory devices exhibit significant and increasing sensitivity to radiation-induced errors. Accurate measurements and comparisons of radiation sensitivities of semiconductor memory devices require the control of test conditions commensurate with the complexity of the devices.
2013-06-26 Designing highly reliable FPGA designs
Learn how to protect FPGA designs from soft errors
2014-05-19 Cypress debuts asynchronous SRAMs with on-chip ECC
The Cypress 16Mb asynchronous SRAMs ensure data reliability in a variety of industrial, military, communication, data processing, medical, consumer and automotive applications.
2006-01-16 Test, repair embedded memories for higher yield
Embedded repair for memories is a key manufacturing technology that can optimize yield and minimize overall test cost.
2010-08-19 Probability chip startup starts off with ECC block
Lyric Semiconductor Inc. is licensing a technique to develop an error correction device for NAND flash
2015-08-31 Exploring the future for SSDs
The migration from BCH codes to LDPC codes is going to enable a lot of great things inside SSDs, including better endurance and latency control.
2002-10-02 Choosing an IP core
IP cores allow design teams to rapidly create large SoC designs by integrating pre-made blocks that do not require any design work or verification.
2015-08-07 Cheaper, denser NAND need better ECC
In this article, we expound why PMC-Sierra switched from Bose-Chaudhuri-Hocquenghem codes to low-density parity check codes for error correction in its solid-state drive controllers
2004-06-10 Silvaco rollout includes mixed-signal simulation
During the Design Automation Conference, Silvaco will bring a new mixed-signal simulator, a full-chip RC extractor, a harmonic-balance simulator, an inductance extractor and a soft-error modeling tool.
2004-08-02 Mixed-signal simulation tool supports Linux
Silvaco's mixed-signal simulator, RC inductance extractor and soft-error modeling tool all support Linux under a new GUI.
2015-04-23 Cypress 4Mb asynchronous SRAMs promise data reliability
The SRAMs simplify designs and cut board space while ensuring data reliability in various industrial, military, data processing, medical, consumer and car applications, without the need for extra error correction chips
2006-01-05 PWM controller offers extra flexibility
Intersil's ISL6420A PWM controller offers programmable switching frequency, programmable soft start, external compensation, a wide DC input, and two package choices
2002-05-02 NEC adds L2 cache, DRAM controller to Vr processor
NEC Corp. has taken the wraps off a MIPS-based 64-bit embedded processor that integrates Level 2 cache and a DRAM controller, both equipped with error-correction coding features
2014-08-08 Build wireless base station MIMO antennae (Part 1)
Here's a review of the relevant MIMO modes and technology, as well as the advantages of choosing a suboptimal maximum likelihood detector receiver over a minimal mean square error receiver
2012-08-27 100Gb/s multiplexer for ultra-long haul apps
Semtech's SMI10022 supports soft-decision forward error correction that claims to offer significant improvement in optical transmission reach for ultra-long-haul and submarine optical links.
2004-01-21 Two IP vendors pave the road to low power
The push for low-power ICs in advanced processes has produced little consensus beyond the notion that no single fix will do.
2013-11-08 ST, Memoir Systems combine memory, process tech
When integrated into products made using ST's FD-SOI, Memoir's Algorithmic Memories claim to deliver uncompromised performance as a result of FD-SOI's recognised power and performance advantages.
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