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2002-11-27 Innovative optical imaging method seen to lower IC test costs
A group of physicists led by Dr. Caesar A. Saloma of the National Institute of Physics at the University of the Philippines have developed an inexpensive optical imaging technique to detect IC defects
2003-02-04 Sarnoff UV camera suit submicron IC inspection equipment
Sarnoff Corp.'s 14-bit back illuminated CCD UV camera module is suited for use in apps such as optical evaluation and subsystem development.
2010-12-02   Xradia demos semicon failure analysis solutions at Semicon Japan
Xradia Inc.'s 3D X-ray solutions make it possible to visualize buried problems without destroying the package, or inducing artifacts that have nothing to do with the actual condition of the package.
2013-06-14 Holst Centre, Imec develop fully-organic imager
The imager is sensitive in the wavelength range between 500 and 600nm, making it compatible with typical scintillators and therefore suitable for x-ray imaging applications
2010-01-28 Tiny piezo motor runs over 7mm/s at low power
New Scale Technologies' SQUIGGLE RV reduced voltage linear drive system delivers performance comparable to much larger motion controls at 40 percent lower power and less than one-fourth the size.
2005-09-08 RF ICs can be quite complex
According to one industry analyst, the worldwide handset RF semiconductor market is expected to grow from $5.3 billion in 2004 to $8.26 billion in 2008
2002-07-02 Board gives vision-based inspection a speed boost
An image-acquisition board from National Instruments can speed the performance of vision-based inspection systems commonly used in making semiconductors, optoelectronics, telecom devices and automotive components.
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