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2001-04-26 Using tabulated s-parameters with SpectreRF
This application note describes how to use tabulated S-parameter descriptions of linear components with SpectreRF.
2007-04-23 Small signal RF-transistor: S-Parameters, Noise-Figure and Intermodulation
With the increasing need to reduce development time, RF designers are increasingly employing simulation tools which need accurate device data. This note is intended to help understand the origin of the values required and to reconstruct a similar setup for own analysis and verification.
2001-04-24 Single-ended and differential s-parameters
This application note explains the use of single-ended and mixed-mode S-parameters for differential circuits, and the basic concepts of microwave measurement calibration.
2004-11-24 Characterizing the S-parameters of 75 circuits using 50 lab equipment
This app note demonstrates S-parameter measurements using a minimum loss pad to transform the conventional 50 test port impedance to the 75 device.
2002-09-20 T/R switch for IMT-2000 handset applications
This application note describes a handset T/R switch design that enables its antenna to be electronically connected to either the transmitter or receiver.
2015-11-12 Achieve consistent differential interconnect measurements
Making sense of a production floor test result in terms of the R&D environment result is difficult. Here is look at a new measurement system touted to solve this problem.
2002-05-02 Three and four port S-parameter measurements
This application note describes introductory aspects on and definition of multiport S-parameters along with some information on interpretation analysis.
2014-04-17 Tektronix upgrades mixed signal oscilloscopes with IBIS-AMI
The MSO/DPO70000 series of digital and mixed signal oscilloscopes now include modelling support with IBIS-AMI models and S-parameters, improving correlation with simulation results.
2001-09-20 Small signal equivalent circuit model
This application note presents a small-signal transistor equivalent circuit model, which can be used for extrapolating and interpolating transistor S-parameters as well as in circuit simulators that cannot handle S-parameters directly.
2010-10-01 Signal integrity network analyzers tout low cost, built-in calibration
LeCroy's SPARQ signal integrity network analyzers offers built-in calibration for up to 40GHz S-parameters
2014-04-30 R&S tanks up network analyser with 24 test ports
The R&S ZNBT allows characterisation with multiple test ports in the 9kHz to 8.5GHz frequency range. It can determine all 576 S-parameters of a 24-port DUT, and carry out multi-port measurements faster than switch matrix-based multi-port systems.
2001-06-15 Pulse transformers
This application note explains the influences of a transformer's parameters by considering a transformer equivalent circuit.
2012-07-19 LeCroy introduces signal integrity network analyzer
New class of instrument simplifies measurements and makes S-parameters readily available
2012-08-23 Fundamentals of RF amplifier measurements
Know how to setup fundamental amplifier measurements such as S-parameters, K-factor gain compression, or pulsed measurements using a vector network analyzer.
2007-10-23 Free configuration tool rolls for Turck RFID system
Turck rolled out a free configuration software that aids in RFID equipment selection by quickly simulating an application's parameters and values.
2005-03-18 Wafer tester monitors RF chip quality in realtime
Keithley Instruments is now introducing a third-generation on-wafer RF measurement capability with some very promising features that address the conundrum.
2003-12-18 UMC says design methodology reduces simulation time
By providing detailed, foundry-specific modeling for RF components, United Microelectronics Corp. claims it can reduce electromagnetic simulation time from a matter of hours to minutes. The company's new Electromagnetic Design Methodology (EMDM) is aimed at customers designing RF CMOS ICs.
2007-05-31 Tool tackles power integrity issues in ICs, packages, boards
Aiming to deliver a comprehensive solution for tackling noise and power at the chip, I/O and PCB design levels, Apache Design Solutions announced its Sentinel product line.
2007-07-11 Time domain analysis using a network analyzer
This document from Agilent will focus on time domain analysis generated from vector network analyzers. The intent is to provide engineers with frequency domain background and an in-depth view of how a time domain display is created from frequency domain data and how to apply the time domain display to common problems in RF systems.
2006-10-11 Tektronix touts significant advancement in TDR test tech
According to Tektronix, its new time-domain-reflectometry (TDR) and electrical modules represent the most significant performance advancement in TDR test technology in 20 years.
2000-12-01 Switch fabrics pave way to scalable networking
Topics span from Infiniband design hurdles to in-box benefits of RapidIO, along with various on-chip switch schemes like SuperHyway for highly integrated system chips.
2008-04-01 Simulate system effects for better design
When it comes to SI design, getting measurements and simulation results to agree takes special considerations.
2004-06-10 Silvaco rollout includes mixed-signal simulation
During the Design Automation Conference, Silvaco will bring a new mixed-signal simulator, a full-chip RC extractor, a harmonic-balance simulator, an inductance extractor and a soft-error modeling tool.
2006-10-26 Sigrity unveils new IC package characterization suite
Promising a new suite of tools that will enable 'fast, easy, accurate and complete' IC package characterization, Sigrity Inc. this week is releasing its SpeedPKG Suite.
2002-09-05 Sequence, UMC address interconnect inductance issues
Sequence Design and UMC have partnered to complete the first silicon correlation of an interconnect self inductance parasitic modeler.
2006-03-16 Rx: New test techniques
New measurement approaches require faster and more efficient and reliable instrumentation and software.
2011-02-11 RF test system suits AESA radar equipment
Rohde & Schwarz unveils the new R&S TS6710 test system, a flexible turnkey standard solution for manufacturers of active electronically scanned array radar equipment.
2005-01-10 RF calibrator crowds out multiple single-function instruments
Rohde and Schwarz's FSMR measuring receivers can serve not only as calibrators but as modulation analyzers, audio analyzers, RF power meters and spectrum analyzers.
2015-09-07 PXIe multiport vector network analyser supports up to 9GHz
Keysight said the M9485A VNA has a true multiport architecture that promises measurement speed up to 30 per cent faster than competing offerings, while maintaining high dynamic range.
2006-06-14 Philips unveils next-gen LDMOS WiMAX solutions
Philips announced its next-generation LDMOS WiMAX line-up for base station solutions, which promises to deliver up to 3.8GHz over the 802.16e mobile WiMAX platform.
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