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2003-02-12 Leakage current called obstacle to chip complexity
The semiconductor industry must reduce leakage current in chip designs by two orders of magnitude over the next 10 years, or face an interruption in projected chip complexity, said professor Takayasu Sakurai.
2008-12-25 Studies address process variability issues
CMOS device process variability remains one of the most acute problems facing the semiconductor world, particularly at the 45nm node and beyond, according to presenters at the International Electron Devices Meeting (IEDM).
2014-02-17 Sensor detects diaper wetness
The sensor is printed on a plastic film using inkjet technology to minimise discomfort for wearers, enabling application to more parts in the human body.
2011-02-16 ISSCS 2011 takes peek at new Imec tech
Among the results to be presented are a biomedical signal processor, a reconfigurable transceiver that eliminates the need for SAW filters and a functional 8bit MCU made by organic thin-film transistors.
2003-09-01 Analog/RF automation for consumer media products
The biggest challenge for consumer media products is the design of low-power analog and RF interfaces and the integration of these interfaces with the embedded system.
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