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2008-03-17 Waveform digitizer PCIe card records up to 2Gsamples
Strategic Test's two-channel 10MSps 12bit waveform digitizer PCIe card can record signals to the card memory of up to 2Gsamples or streamed at full rate to the host PC.
2004-12-21 Video test gear gets HDMI v1.1 support
Quantum Data will soon be rolling out an upgrade to its 802-series of HDMI generators and analyzers.
2004-02-02 Vectorless test: Best bet for high-speed I/O
An approach called vectorless test is emerging that offers the best of both approaches: the cost effectiveness of on-chip I/O BIST combined with ATE-based signal integrity measurements
2004-06-11 Tyco card edge connectors offer press-fit connections
Tyco Electronics presented its next-generation AMP PACE card edge connectors that accept 0.054-inch to 0.070-inch daughtercards
2004-02-02 Toolset eyes process test-chip design
Silicon Canvas released a platform for process test-chip development that is designed to help foundries create test chips to verify, optimize and calibrate silicon processes
2003-12-10 Tool set eyes process test-chip design
Silicon Canvas Inc. will release a platform for process test-chip development that the company calls the first commercial product of its kind. The Laker T1 platform is designed to help foundries and integrated device manufacturers create test chips to verify, optimize and calibrate new silicon processes
2011-07-12 Test system targets 3D, 28nm node ICs
Verigy has released a new generation of test systems for advanced semiconductor designs, including 3D device architecture and IC designs for 28nm technology node and beyond
2005-03-17 Teradyne supplies RFID test systems to J750 systems
Teradyne Inc. disclosed that Beijing Huada, a VLSI testing service and solution provider for Beijing and Northern China, has purchased multiple J750 test systems to meet production capacity for RFID smart card testing.
2002-11-29 Telecom test project stirs interest at Ixia
Motivating a team to design a compact test module for 40Gbps networks was not the easiest thing in the world at a time when market analysts were warning that 40Gb telecommunications transport would remain mired in overcapacity for quarters, or even years, to come
2002-07-12 Tektronix offers wavelength selectable 10Gbps transmission test system
Tektronix Inc. has announced that its OTS9100 series of modular optical test system now offers what is claimed to be the industry's first fully integrated wavelength selectable 10Gbps transmission test system
2004-12-13 TDK rolls out smart card reader software stack
TDK released a smart card reader software stack that will facilitate the design of its controller-based smart card reader ICs into ready-to-use smart card reader modules
2007-09-18 Switching/DMM test solutions control up to 576 channels
Keithley's Series 3700 switching/DMM test solutions offer instrument-grade switching for a wide variety of applications including high-channel count applications with its capability to control up to 576 multiplexer channels in a six-slot, 2U form factor
2006-03-14 SV Probe acquires wafer test assets from K&S
SV Probe announced recently that it has executed the acquisition of the wafer test assets from Kulicke and Soffa Industries, one of the world's leading supplier of semiconductor wire bonding assembly equipment
2008-05-19 Strategic Test PCI, PCIe cards get memory upgrade
All of the PCI and PCIe cards for PCI digitizers and waveform generators from Strategic Test have been upgraded with 256MBytes of on-board memory
2006-10-26 Strategic Test announces 'smallest' Monahans P SOM
Strategic Test has unveiled the smallest Intel/Marvel "Monahans P" system-on-module called the TRITON-290
2004-11-11 Straddle-mount card edge connectors aid in PCI Express validation
FCI's new straddle-mount card edge connectors support the implementation of the high-speed, serial PCI Express architecture in desktop PCs and servers
2005-08-02 ST achieves EAL5+ certification for 32-bit smart card MCU
STMicroelectronics announced that the established ST22L128 32-bit secure microcontroller has received 'Common Criteria' security certification at Evaluation Assurance Level EAL5+ (Augmented).
2003-10-29 Sony, Docomo to jointly develop smart-card phones
Sony and NTT Docomo have agreed to combine their respective technologies in an effort to make mobile phones function as personal devices and pocket books.
2005-09-23 Smart-card ICs are purely flash based
Silicon Storage Technology's recently acquired business unit, Emosyn has developed a smart-card IC line called Theseus Titanium that it is targeting at the SIM and 3G USIM markets
2003-02-20 SiS graphics card adds VIVO functionality
SiS Corp. has announced that its Xabre600 graphics chipset solution now offers VIVO functionality.
2003-12-04 Silicon Image establishes DVI compliance test center
Silicon Image Inc., a provider of multi-gigabit semiconductor solutions, has opened a new Digital Visual Interface (DVI) Compliance Test Center (CTC
2010-07-23 Seica test systems suit military and aero apps
Test and production solutions provider Seica Inc. demonstrates its Valid Integrated Functional Test System
2009-10-02 SD card enables low-cost Wi-Fi connectivity in digicams
Eye-Fi offers Share, a Wi-Fi-enabled Secure Digital (SD) card that makes it easy and affordable to add Wi-Fi connectivity to any digital camera with an SD card slot
2002-07-25 SBS 3910 interface card targets avionics apps
SBS Technologies Inc.'s ABI-3910 6U VME interface card is designed for simulation, test, data-acquisition, and avionics apps that need fast data transfers.
2002-03-14 SanDisk offers 1GB CompactFlash card, Flash development kits
The company has announced the availability of its 1GB CompactFlash memory card for high-resolution digital cameras, digital music players, PDAs, and other handheld consumer electronic devices
2002-04-05 Samsung smart card IC meets EMV standard
Samsung Electronics has announced the availability of smart card ICs targeted for the lower capacity requirements of the EMV standard for credit cards
2003-03-07 Samsung adopts Agilent smart card IC test solution
Samsung Electronics Co. Ltd has selected Agilent Technologies Inc.'s Versatest Series Model V3300 contactless smart card IC solution to test combi-smartcards for use in transportation, banking and identification applications.
2014-04-07 Resistors cover a versatile range for test systems
Pickering Interfaces has released an addition to its family of PCI and PXI programmable resistors, allowing engineers to choose the most appropriate platform for their systems.
2009-09-22 PXI tester supports full IC logic test
OpenATE has launched the open source PE16 PXI tester and the MTS2 software platform to address the increasing IC testing needs.
2006-06-15 Probe 2000, Best Electronics open probe card ops in the Philippines
Probe 2000 and Best Electronics have agreed to set up a new probe card repair and manufacturing operation in Best Electronics' semiconductor test factory in the Philippines.
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