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2007-04-30 X-ray inspection system delivers high-throughput 3D coverage
Agilent Technologies says its Medalist x6000 3D X-ray inspection systems offer more than double the throughput of leading 3D solutions while using full 3D capability to find PCB assembly (PCBA) solder and manufacturing assembly defects.
2005-03-29 UMC uses Mentor embedded compression solution for production test
United Microelectronics Corp. (UMC) has adopted Mentor Graphics Corp.'s TestKompress embedded deterministic test (EDT) tool for use in 90- and 130nm reference flows
2013-06-19 TrueSTUDIO v4.1 bolsters embedded test support
Atollic's TrueSTUDIO v4.1 includes the ability to record and display instruction trace data, aiding embedded developers maintain software quality.
2014-07-07 The cost of overlooking design-for-test
To prevent costly printed circuit board rework, it is important to have an effective DFT strategy based on a close partnership and working relationship between PCB design and test engineering
2007-04-16 Test systems spell 3G LTE future
The test-and-measurement community must help ensure a smooth migration to LTE so that pitfalls associated with past rollouts of next-gen cellular networks can be avoided
2011-07-12 Test system targets 3D, 28nm node ICs
Verigy has released a new generation of test systems for advanced semiconductor designs, including 3D device architecture and IC designs for 28nm technology node and beyond
2011-08-26 Test system enables coverage at branch, block level
Wind River has introduced the latest version of Wind River Test Management that identifies high-risk segments in production code and enables optimized testing that focuses on changes between builds
2007-05-17 Test suite minimizes probing damage
Aeroflex has added soft landing and partial accessibility software options to its 4550 flying probe test system for PCB testing
2005-01-03 Test experts ponder cost of defects
Is 100 DPPM too tough to be practical for designs in 100nm or finer processes?
2001-01-01 Test coverage enhancements at the register transfer level
This technology article describes the RTL buffer insertion and fault grading that helps identify untested functions and low-fault coverage areas where added test vectors can be generated.
2010-11-04 Test coverage analysis tool features yield estimation
ASTER's TestWay Express now allows estimates for new product yields
2002-10-21 Teradyne to test VIKO wireless devices
VIKO Technology Inc. has selected Teradyne Inc.'s Catalyst Test System to be used on a range of its wireless devices
2010-11-19 System brings boundary-scan test to small designers
Corelis Inc.'s TestGenie offers a low-cost, low-risk boundary-scan test solution for companies with limited resources, minimal JTAG experience, fixed schedules and tight test budgets
2002-07-15 RFMD, STATS adopt Teradyne test systems
RF Micro Devices and ST Assembly Test Services Ltd will ramp Bluetooth device production on Teradyne Inc.'s Catalyst test systems
2016-05-16 RF conformance test system validated for LTE UL CA, UL 64QAM
The R&S TS8980 from Rohde & Schwarz provides test coverage for Rel. 8 to Rel. 13 versions of 3GPP 36.521-1, 36.521-3 and supplementary RF/RRM test plans for wireless network operators.
2005-01-03 Reduce test times in next-gen cellular systems
Functional testing can increase test coverage without increasing overall test times. Find out how.
2011-09-22 Real-time testing, HIL tools cut test dev't time
The NI VeriStand 2011 expands deterministic test execution with looping and branching structures and multitasking
2010-04-26 PXI measurement suite cuts TD-SCDMA test costs
From Aeroflex comes the PXI 3030 TD-SCDMA measurement suite designed to provide fast and cost-effective production testing of mobile handsets and RFICs.
2012-08-27 Parallel voltage measurements in functional test of car ECUs
Know how to use a multichannel high voltage DAQ module to improve fault coverage
2010-11-08 One-step PCB test system unveiled
JTAG Technologies merges boundary scan option with Digitaltest's combinational test system for easy PCB testing
2008-07-18 MTNet taps Aeroflex platform for CDMA, A-GPS test
MTNet, the CDMA Certification Forum (CCF) accredited conformance test lab established within China's Ministry of Information Industries, has standardized on the Aeroflex 6402 AIME CDMA test platform for 1xEV-DO Rev A and A-GPS testing
2005-06-30 Mentor Graphics scan test tool in TSMC's Reference Flow 6.0
Mentor Graphics announced that TSMC has added the TestKompress scan test tool to its Reference Flow 6.0
2008-12-12 LitePoint debuts 'first' device test for Multicom
LitePoint Corp. has launched the first device test solution designed specifically for Multicom devicessingle devices containing multiple radios and wireless connectivity standards
2008-04-01 Innovative flying probe test, soldering solution debut
Seica has announced its new Pilot V8 flying probe test system and the Firefly selective soldering solution, which will be exhibited at this week's IPC Printed Circuits Expo, Apex and the Designers Summit
2008-03-25 Hybrid tech removes physical test points for ICT
Agilent Technologies has introduced a limited access solution for in-circuit test (ICT) users that eliminates the need for physical test points
2015-07-20 HIL simulation for hybrid powertrain test
In this article, we explore how development of motor ECUs can be accelerated substantially through the application of hardware-in-the-loop methods.
2015-01-19 Guidelines boost test quality in advanced CMOS nodes
The best way to achieve high defect coverage is to apply tests other than the conventional stuck-at and transition tests. Here's a list of the guidelines that help improve test quality.
2005-09-01 Functional test targets Intel silicon
ASSET InterTech and International Test Technologies are jointly developing support for Intel Interconnect Built-In Self Test (IBIST) embedded test technology
2005-10-20 Design-for-test analyzer validates boundary-scan
A product called DFT Analyzer from ASSET InterTech promises to reduce manufacturing and test costs when it debuts early next year
2007-08-16 Create high-quality program for at-speed test
At-speed test has been improved by a number of new capabilities, including the use of on-chip-generated functional clocks during test mode. This article offers some do's and don'ts for creating a high-quality program for at-speed test
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