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2010-05-24 Trina Solar inks test deals with China certification groups
Trina Solar, through its subsidiary, Changzhou Trina Solar Energy, has signed strategic teal agreements with TUV Rheinland, Underwriters Laboratories and China General Certification Center.
2014-01-28 Trimming down automated test rack size
Many automated test stations are made up of racks of individual test instruments. In many cases, you can replace them with modular instruments
2006-12-18 Test tool optimizes data for IC yield
LogicVision Inc. touts its solution Yield Insight to provide "yield learning," a process in which test failure data can pinpoint potential yield problems.
2007-12-11 Test system reduces cost of SoC testing
Advantest has introduced a compact test solution designed to lower the cost of testing SoC devices used in digital consumer products and automotive electronics
2006-03-10 Test software enhances large data-set signal acquisition/analysis
Test and measurement software from National Instruments and Agilent Technologies make data-set signal acquisition and analysis easier.
2007-05-14 Test software enables enterprise-wide collaboration
VI Technology Inc.'s Arendar 2007 test platform expands on the highly-configurable and expandable Arendar platform to provide instant access to design, characterization, validation and verification, and manufacturing test information across the enterprise
2011-07-04 Test set supports RF parametic, protocol testing
Aeroflex's options 103 and 105 for the 7100 LTE digital radio test set facilitate testing for multimode communication devices
2004-02-20 Teseda, Agilent certify STIL link between DFT, production test
Teseda Corp. and Agilent Technologies Inc. have announced the first link that ensures transportability of Design-for-Test (DFT) data between engineering and production test platforms, wherein customers of the Teseda V500 and the Agilent 93000 SOC Series can quickly and reliably validate, debug, and apply IEEE 1450 (STIL)-based production test data generated by EDA tools.
2012-10-24 Start-up focuses on data overload in silicon mfg and test
Qualtera's Silicondash is an automated decision support system for semiconductor test data analysis that runs in a choice of secure data centres.
2004-11-03 Software promises realtime test, product quality, performance insight
SigmaQuest is rolling out a new product that provides actionable information that can help ensure product intergrity and process integrity.
2006-11-29 OptimalTest promises better yields through test management
OptimalTest has launched what it touts as the optimal test software suite for maximizing IC yields through managed test results
2004-02-02 Open architecture ATE tackles test woes
The basic idea behind the open architecture test system is to provide such modularization with specific focus on the use of third-party modules and test instruments
2007-12-07 ON Semi opens IC protection test lab in China
ON Semi has opened a Circuit Protection Applications Test Laboratory in Shanghai, China to support its APAC customers
2008-07-11 NI expands test data management, visualization
National Instruments has released DIAdem 11.0, the latest version of the interactive software for managing, analyzing and reporting test data.
2003-05-05 Newport opens new systems test, metrology lab
Newport Corp. has launched its newly-enhanced systems test & metrology lab located at the company's global headquarters in California, U.S.A
2014-04-22 Mining big data sees increasing value across businesses
Companies are placing a premium on big data, seeking to harness it and boost overall business processes. This creates an urgency to narrow, if not close the gap between data and usable information with intelligent data analysis
2005-06-30 Mentor Graphics scan test tool in TSMC's Reference Flow 6.0
Mentor Graphics announced that TSMC has added the TestKompress scan test tool to its Reference Flow 6.0
2015-04-20 Managing measurement data with openMDM
In this article, we will explore openMDM, a software platform which enables the user to manage measurement data for long-term and systematic usability
2006-06-16 Low-power IC test can be trying
For designers, power management means controlling leakage power lost during standby mode and dynamic power consumption when multiple transistors switch in unison to perform desired functions.
2003-10-02 Infineon releases test chip for fault localization
Infineon Technologies AG has manufactured a test chip that enhances complex semiconductor design processes
2012-06-01 HP lab test claims to lower data center power
The HP Net-Zero Energy data center techniques cut total power use by 30 percent and reduced use of the utility grid by nearly 80 percent in HP Labs tests
2005-03-23 Freescale Semiconductor opens test center in Japan
Freescale Semiconductor has opened a test and quality center in Nagoya, Japan to support automotive manufacturers located there
2001-03-01 Embedded test complicates SoC realm
SoC devices today implement a variety of specialized microelectronic functions. Those functions, sometimes with embedded systems, typically comprise of hardware or software design objects.
2013-09-11 DFTMAX Ultra boasts higher compression, fewer test pins
DFTMAX Ultra efficiently streams compressed test data in and out of the design-for-test circuitry, lowering the amount of data required to achieve high manufacturing test quality of silicon parts.
2007-03-16 Cooperation sparks hope for new IC test standard
With the OCI effort, the four largest EDA vendors�Cadence, Synopsys, Mentor Graphics and Magma Design Automation�were able to set politics aside and work together to come up with a solution. Maybe the time has come to take a further step.
2005-08-09 Cascade Microtech' digital imager zooms in for precise wafer test
Cascade Microtech is debuting a new system combining microscopy, digital imaging and prober control software that promises to save hours each day.
2011-12-02 ATML standard eases test equipment data exchange
An XML-based standard for ATE and test information data exchange, known as Automatic Test Markup Language, has emerged with widespread support among test and measurement industry leaders and major government programs alike.
2011-03-28 ZTE announces record-breaking 10Tbps data transmission rate
ZTE claims to achieve a record-breaking rate of 10Tbps over 640km of optical fiber using its carrier generation technology generating 112 coherent and frequency-locked optical sub-carrier signals.
2002-03-04 Zarlink parallel fiber modules features 30Gbps data rate
The MFT62340A-J transmitter and MFR62340A-J receiver 12-channel parallel fiber modules offer a channel data rate of 155Mbps to 2.5Gbps, for an aggregate bandwidth of 30Gbps
2006-09-13 Xyratex expands data storage operations in Asia
Xyratex, a spinoff in 1994 from IBM's data storage and manufacturing operations, has acquired Jastam Trading of Japan for about $1.5 million
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