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2008-07-14 Wireless test systems integrate wider signal capabilities
LitePoint Corp. has launched three new systemsthe IQnxnplus, IQultra and IQnay for testing four wireless standards.
2007-07-19 WiMAX test system revs up production throughput
Agilent Technologies Inc. and GCT Semiconductor Inc. have partnered to jointly implement a WiMAX manufacturing test system for GCT's WiMAX chipsets.
2008-07-15 Voice response system ensures high QoE for VoIP
Tektronix Communications has introduced Zoey, an Interactive Voice Response system that allows VoIP, wireless and analog phone users to test and diagnose the quality of their service at any time, effectively enabling the customer to have control over their own QoE.
2002-04-29 Virtual Silicon selects IMS test systems for embedded memories
Virtual Silicon Technology has selected Integrated Measurement Systems' (IMS) Orion memory engineering validation test system for design verification of its 0.25?m non-volatile embedded memory cores.
2002-11-14 VIA tests chipsets featuring Agilent 93000 SoC system
VIA Technologies Inc. has chosen to implement Agilent Technologies Inc.'s 93000 SoC series test system to test its next-generation microprocessor chipsets.
2004-05-06 VeriWave fields test system for WLANs
VeriWave has introduced hardware and software that tests WLAN conformance and reliability at all stages of system development
2015-02-23 UT3 platform begins test cases for LLCP, SNEP Phase 2
NFC Forum allowed COMPRION to conduct test cases for the second phase of Logical Link Control Protocol (LLCP) and Simple NDEF Exchange Protocol (SNEP
2003-05-26 Tripath deploys Credence signal test system
Tripath Technology Inc. has purchased a test system by Credence Systems Corp.
2003-05-21 Toyo FPD materials to be tested on Integral Vision system
Toyo Corp. has chosen Integral Vision Inc. to take part in the development of a Lifetime Testing system for FPD materials
2003-09-15 Toshiba deploys Keithley IC test system
Toshiba Corp. has selected Keithley Instruments' S630DC/RF parametric test system to support production of its new generation of semiconductors.
2008-05-26 Tool cuts test time for automotive devices
Advantest has introduced the T7723 mixed-signal test system with high-throughput and highly parallel test capabilities for testing high-density automotive devices.
2005-02-23 The 'first system for deep level testing of 3G phone, USIM, network interoperability
Aspects announced what it claims as the industry's first system for deep level testing of 3G phone, USIM and network interoperability that can be deployed and used productively in less than half a day
2015-07-07 Thai NBTC picks R&S test system for DVB-T2 receiver compliance
The combination of R&S BTC RF test automation system with StreamSpark PSI/SI test suite allows smooth transmission of HD contents over T2 networks in major cities such as Bangkok and Chiang Mai.
2008-06-02 TestStand 4.1 with multicore support ups test throughput
National Instruments' latest version of the TestStand test management software 1 helps engineers develop faster test systems with multicore processor support
2010-02-23 Tests system extends test environment life cycle
Aeroflex has rolled out the SMART^E 5300 DC to 40GHz general-purpose test environment that tests, monitors and controls any device under test (DUT) within a single test environment
2009-02-18 Testing an OFDM-based MIMO system
This article looks at a few key parameters and the tests needed to tell how an OFDM-based MIMO system is performing
2002-08-16 Test systems move to the desktop
This technical article introduces a low-cost, efficient desktop test system aimed to replace traditional, expensive automated testing systems.
2007-11-12 Test system targets multiple memory MCP devices
A high-speed, high-throughput memory test system for MCPs has been introduced by Advantest Corp.
2011-07-12 Test system targets 3D, 28nm node ICs
Verigy has released a new generation of test systems for advanced semiconductor designs, including 3D device architecture and IC designs for 28nm technology node and beyond
2003-05-16 Test system simulates and validates ECMs
VI Engineering provided the services for a major automotive supplier that wanted them to specify and develop a test system for simulation and design validation of the company's ECMs.
2007-12-11 Test system reduces cost of SoC testing
Advantest has introduced a compact test solution designed to lower the cost of testing SoC devices used in digital consumer products and automotive electronics
2013-11-06 Test system offers LTE-A carrier aggregation support
Agilent announced software options for the T4010S LTE RF and T4020S LTE RRM test systems, providing coverage for LTE-Advanced Carrier Aggregation test cases as defined by the 3GPP
2011-04-19 Test system measures, analyzes ILS signal
Rohde & Schwarz offers manufacturers and operators of aeronautical radio navigation systems a solution for verifying their instrument landing systems with the R&S TS6300 test system.
2011-08-26 Test system enables coverage at branch, block level
Wind River has introduced the latest version of Wind River Test Management that identifies high-risk segments in production code and enables optimized testing that focuses on changes between builds
2014-10-29 Test system aimed at next-gen display driver ICs
The T6391 from Advantest can handle I/O pin frequencies up to 1.6Gb/s, allowing it to test DDIs that use mobile industry process interface (MIPI), the standard protocol for mobile electronics
2012-02-28 Test suite supports WLAN 802.11ac measurement
The PXI 3000 series test system from Aeroflex performs parametric measurements for manufacturing.
2007-05-17 Test suite minimizes probing damage
Aeroflex has added soft landing and partial accessibility software options to its 4550 flying probe test system for PCB testing.
2012-02-20 Test suite geared for TD-SCDMA app enablers
The test system includes new use cases for MMS, browsing, streaming and video telephony, specifically for CMCC's TD-SCDMA acceptance plans.
2006-03-10 Test software enhances large data-set signal acquisition/analysis
Test and measurement software from National Instruments and Agilent Technologies make data-set signal acquisition and analysis easier
2007-05-14 Test software enables enterprise-wide collaboration
VI Technology Inc.'s Arendar 2007 test platform expands on the highly-configurable and expandable Arendar platform to provide instant access to design, characterization, validation and verification, and manufacturing test information across the enterprise
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