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What is ATPG (Automatic Test Pattern Generation)?
The automatic creation of test patterns or "vectors" used to verify the operation of an electronic circuit. The "goodness" of a set of test vectors is based on "fault coverage" or the ability of the set of test vectors to identify any manufacturing or design defects in the circuit.
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2008-04-11 Yahoo to test of Google's AdSense service
Yahoo has announced that it will begin a limited test of Google's AdSense for Search service, which will deliver relevant Google ads alongside Yahoo's own search results.
2013-10-04 Xicanto unveils low cost LM-79 test program for LEDs
The new LM-79 test service lowers testing costs by 50 per cent per luminaire, and reduces testing turn-around time to just 5 business days.
2005-04-28 WLAN test suite runs on Windows PCs
Offering a suite of software tools that can help generate and analyze WLAN (wireless local area network) signals, Lyocom now provides a range of testing capabilities that can run on PC platforms.
2010-05-26 WLAN test solution validates actual network traffic
VeriWave's WaveDeploy WLAN site assessment solution analyzes network readiness, real performance and the impact of growth and change, with a single pass through a facility.
2005-11-02 Wireless USB tools to address ultra-wideband development, test
New protocol analysis and traffic-generation tools promise to provide insight at each stage of a product's development lifecycle.
2008-07-14 Wireless test systems integrate wider signal capabilities
LitePoint Corp. has launched three new systemsthe IQnxnplus, IQultra and IQnay for testing four wireless standards.
2009-03-20 Wireless test solutions support CPRI, OBSAI
mimoOn GmbH has released solutions for wireless infrastructure and test & measurement equipment based on CPRI and OBSAI interfaces.
2011-08-05 Wireless test platform offers accurate OTA
octoScope's octoBox is a wireless testing product that offers accurate OTA testing of conventional and MIMO wireless devices in a customisable refrigerator-sized anechoic enclosure.
2005-04-14 Wireless PHY test software works in LabVIEW
SeaSolve Software's test suite is tightly coupled with existingand provensignal analyzer and signal generator hardware.
2004-04-22 Wireless PDA application test bed
This paper presents an embedded system platform for wireless technology research and product development.
2011-09-22 Wireless communications to boost test market
The proliferation of mobile devices and wireless networks raises the demand for wireless test solutions.
2009-05-14 Wipro test facility rises in Bangalore
Wipro Technologies has launched Tarang, a product qualification and compliance certification facility, in Bangalore, India.
2003-06-18 Winstek installs Agilent SoC test systems
Winstek Semiconductor Corp. has purchased and installed 15 of Agilent Technologies Inc.'s 93000 SOC Series test systems.
2016-04-08 Windows 10 supports graphical programming for test automation
Keysight ensures that Visual Engineering Environment (VEE) customers have continued Microsoft Windows OS support and eventually a transition path to future Keysight software solutions.
2007-07-19 WiMAX test system revs up production throughput
Agilent Technologies Inc. and GCT Semiconductor Inc. have partnered to jointly implement a WiMAX manufacturing test system for GCT's WiMAX chipsets.
2006-09-14 Wi-Fi Alliance, CTIA launch Wi-Fi/mobile phone test program
Wi-Fi Alliance and CTIA jointly developed a testing program for Wi-Fi/mobile phones and released a test document for laboratory tests that provide RF performance mapping in a mixed-network environment.
2008-02-01 Why is effective isolation important during test?
According to Yeo Siok Been of Avago Technologies, safety isolation is important for test and measurement equipment to ensure data integrity and to protect test operators. Isolators are selected based on its speed performance and most importantly, based on its insulation levels and ratings to meet required safety standards.
2005-09-12 Why Class D amplifiers may test well but often sound terrible
Class D amplifiers are fundamentally different from analog amplifiers, not only in their circuitry, but more importantly in the way they operate
2015-10-30 VNA test cables support operation up to 40GHz
The ruggedised VNA test cables from Pasternack have a maximum phase change of 5 at 40GHz with typical calibration procedures, geared for harsh test lab use and production testing.
2002-04-29 Virtual Silicon selects IMS test systems for embedded memories
Virtual Silicon Technology has selected Integrated Measurement Systems' (IMS) Orion memory engineering validation test system for design verification of its 0.25?m non-volatile embedded memory cores.
2004-03-18 Vimicro selects Teradyne J750 for audio processor test
China-based chip solution provider Vimicro Corp. will use Teradyne Inc.'s J750 MSO system to test a new audio processor device designed to provide high-quality music ring tones and game sounds for mobile phones.
2004-12-21 Video test gear gets HDMI v1.1 support
Quantum Data will soon be rolling out an upgrade to its 802-series of HDMI generators and analyzers.
2002-09-17 VIA to use LogicVision test systems
VIA Technologies Inc. has adopted LogicVision Inc.'s Embedded Test technology for its next chip designs.
2004-05-06 VeriWave fields test system for WLANs
VeriWave has introduced hardware and software that tests WLAN conformance and reliability at all stages of system development.
2006-11-01 Verify macro model accuracy with PSpice test circuits
Instead of investigating op-amp macro models' shortcomings, it would be wiser to have a collection of circuits that allows users to test any model.
2003-09-24 Verification, test providers form outsourcing body
Six providers of services and tools for IC verification and test have banded together to form Expert Services and Tools for Semiconductors (ESTS).
2002-02-25 Velio, Alvesta develop, test OC-192 VSR optics solutions
Velio Communications Inc. and Alvesta have completed the interoperability testing of Velio's SONET-EOS family with Alvesta's 3100 optical transceiver.
2004-02-02 Vectorless test: Best bet for high-speed I/O
An approach called vectorless test is emerging that offers the best of both approaches: the cost effectiveness of on-chip I/O BIST combined with ATE-based signal integrity measurements.
2010-01-28 Vector signal analyzer, generator improve test times
The NI PXIe-5663E 6.6 GHz vector signal analyzer and the NI PXIe-5673E 6.6 GHz vector signal generator improve automated test times for a wide range of devices
2005-05-04 UTMI+ OTG transceiver passes Hi-Speed USB test
Standard Microsystems has developed a standalone, hi-speed physical layer transceiver (PHY) that supports the highest level in the UTMI+ standard.
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