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What is ATPG (Automatic Test Pattern Generation)?
The automatic creation of test patterns or "vectors" used to verify the operation of an electronic circuit. The "goodness" of a set of test vectors is based on "fault coverage" or the ability of the set of test vectors to identify any manufacturing or design defects in the circuit.
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2006-04-17 Specs flap is mobile TV's next test
Speakers at the recent DVB World warned that the incompatibility of two protocols developed to deliver interactivity and content protection to handsets could irreparably splinter the emerging market.
2002-07-19 Sorensen 600W test supply fits in 1U, half rack
The DLM 600W supply, now available from the Sorensen division of Elgar, comes in three high-voltage models.
2004-05-26 Sony's 300mm fab starts test production of Cell processor
Sony Corp.'s Nagasaki 300mm fab has begun test production of Cell processors, Ken Kutaragi, Sony's executive deputy president and COO, acknowledged this week. He declined to elaborate.
2006-09-01 Solving the MCP memory test challenge
Multichip packages (MCPs) are the standard for cellphones, with nearly all modern cellphones having at least one MCP. Using MCPs allows manufacturers to offer the new multifunction devices while maintaining small form factors.
2009-03-26 Solution supports CTIA A-GPS over the air test
The combined offering of Spirent's A-GPS instrumentation and ETS-Lindgren's OTA test facilities, antennas, and EMQuest software allows wireless device manufacturers to test their products in compliance with the upcoming 3.0 release of the CTIA's test plan for mobile station OTA performance.
2006-11-16 Software-only test suite ushers in VoIP tests
Ixia Communications Inc. is introducing its first software-only test suite for VoIP.
2005-04-08 Software upgrade doubles test capacity for memory devices
An enhanced version of TCS for MOSAID's MS4205 family of memory test systems doubles the test capacity for memory chips to 8Gb.
2007-07-17 Software test suite rolls for 3GPP LTE products
Agilent Technologies announced the availability of its Signal Studio for 3GPP Long Term Evolution (LTE) software.
2004-11-03 Software promises realtime test, product quality, performance insight
SigmaQuest is rolling out a new product that provides actionable information that can help ensure product intergrity and process integrity.
2007-07-31 Software eases digital RF test signal creation
Tektronix has rolled out an advanced software solution that performs RF/IF/IQ waveform creation and edits digitally modulated signals.
2005-08-30 Software adds AWGN simulation to mobile carrier-noise test
Test equipment maker Aeroflex is now including an AWGN (additive white Gaussian noise) source to its existing IQCreator software.
2000-12-01 SoCs likely to pose heading-off test problems
This technology news article describes the problems and solutions test engineers should face when confronting SoC designs.
2004-02-02 SoCs challenge production test methods
The success of the SoC has driven down direct silicon costs as a component of system cost, it has accentuated the very factor engineers are struggling to control: test cost.
2002-05-14 SoC test reels out of control
System-level IC testing, already complicated by increasing chip capacity and the growing use of third-party intellectual property (IP), is now being threatened from another quarter.
2010-09-14 SoC test platform integrates customizable modular solutions
Advantest integrates OptimalTest's solutions in semiconductor test equipment
2002-02-16 SoC complexity demands new test strategies
This technical news article describes an overview of how with the complexity of new methods in testing and verifying SoC designs, engineers should learn to tweak their strategies to accommodate a more versatile SoC production run.
2003-04-01 SMIC to deploy Teradyne logic, mixed-signal test systems
Semiconductor Mfg Int. Corp. has purchased multiple logic and mixed-signal test systems from Teradyne Inc., for a range of applications at wafer test.
2007-03-20 SMIC partners with Cascade, Agilent for RFIC design, test
SMIC announced separate partnerships with Cascade Microtech and Agilent Technologies to provide RFIC services for RF design engineers in greater China.
2007-04-12 SK Telecom opens TD-SCDMA test bed center in Seoul
To facilitate the commercialization of China's TD-SCDMA 3G mobile technology, SK Telecom Co. has opened a new test bed center in Bundang, southeast of Seoul.
2004-06-17 SiS buys low-cost production test solutions from Agilent
Silicon Integrated Systems Corp. (SiS) has purchased manufacturing test solutions from Agilent Technologies Inc. for its PCI Express devices.
2002-10-14 SIPEX to move test operations overseas
Sipex Corp. has announced that it will restructure its manufacturing operations.
2016-02-24 Singtel, Ericsson to test 5G mid-2016
Low-powered IoT devices bring Singtel a step closer to its 5G goals, with new device and sensor technologies leveraging network connectivity making vehicle-to-infrastructure connectivity possible.
2008-09-05 Single test system for LTE debuts
setcom wireless positions the S-CORE conformance and research test environment for LTE protocol testing and monitoring.
2005-02-16 Single instrument speeds up wireless test
Using a WLAN test set, the production of a wide range of products will be faster and more repeatable.
2002-05-07 Simplify manufacturing by using automatic test equipment for on-board programming
This application note provides design information and benchmark data to help ATE vendors integrate Flash memory programming into their manufacturing test procedure.
2007-11-01 Simplify HDMI test with the right platform
This article describes HDMI key tests that ensure validation, the challenges faced while testing complex HDMI signals and how oscilloscope-resident test software enables unprecedented efficiency improvements with reliable results and unprecedented automation to perform a wide range of tests.
2007-09-10 Simplay opens HDMI test lab in Germany
Simplay Labs has opened a new lab in Hanover, Germany to help manufacturers test consumer electronics products for interoperability performance.
2007-01-26 Silicon Image picks Agilent's tool for HDMI test
Silicon Image Inc. has adopted Agilent Technologies Inc.'s equipment for HDMI CTS 1.3a source and sink compliance testing and characterization in its HDMI Authorized Test Center.
2003-12-04 Silicon Image establishes DVI compliance test center
Silicon Image Inc., a provider of multi-gigabit semiconductor solutions, has opened a new Digital Visual Interface (DVI) Compliance Test Center (CTC).
2005-09-01 Signal integrity puts high-speed backplanes to the test
The proliferation of serial links beyond 10Gbps has exposed signal-integrity issues not typically encountered in the standard digital design laboratory
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