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What is ATPG (Automatic Test Pattern Generation)?
The automatic creation of test patterns or "vectors" used to verify the operation of an electronic circuit. The "goodness" of a set of test vectors is based on "fault coverage" or the ability of the set of test vectors to identify any manufacturing or design defects in the circuit.
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2011-03-16 Test mobile supports 3GPP DC-HSDPA Release 9
Aeroflex Inc. releases the TM500 Test Mobile, which supports the 3GPP DC-HSDPA Release 9 standard to the multiple UE emulation product.
2012-04-05 Test mobile adds Cat5 UE emulation capability
The TM500 LTE from Aeroflex offers demodulation and decoding of downlink signals transmitted in 4x4 MIMO and transmission of uplink signals modulated using 64QAM, in support of higher LTE data rates.
2011-08-01 Test kit for Android enables enhanced user experience
Wind River's Android test development kit validates device user experience by reproducing human interactions to test user interfaces.
2005-06-15 Test instruments support Bluetooth EDR transmitter test cases
Here's some new test software that lets Anritsu's MT8850A and MT8852A Bluetooth test sets perform all three enhanced data rate transmitter measurements defined in the latest Bluetooth standard.
2014-05-13 Test instruments advance fool-proof user interfaces
Innovations in test equipment do not only feature improved accuracy and sensitivity, but also better and more intuitive user guidancewith touch screen interfaces and Internet-accessible measurements.
2010-03-26 Test instrument handles BER, eye pattern analysis
From Anritsu comes the MP2100A BERTWave measurement solution, an all-in-one instrument that performs simultaneous BER measurements and eye pattern analysis of active optical devices.
2000-01-01 Test industry catches up with engineering demands
The test industry has been catching up with the demand for technical features during 1999. The year ahead is expected to be slated for both an increased demand from engineers and better test solutions from vendors.
2008-07-01 Test highlights Bluetooth issues
IMT-2000 and 802.11 radios will interfere with each other unless they are located approximately 8m apart for 2.6GHz and 16m apart at 2.3GHz.
2010-08-03 Test framework speeds Android app development
Wind River announces the Framework for Automated Software Testing (FAST) for Android, an automated software testing solution for Android-based devices.
2001-04-06 Test fixtures for high-speed logic
This application note details Philips Semiconductors' highly versatile bench-test AC fixture that is specifically designed to address the company's high-speed logic families, such as the FAST, ALS, ABT, LVT and ALVT devices.
2009-02-13 Test finds 3G handset reliability glitches
A testing study by Signals Research Group (SRG) focusing on popular 3G handsets found dramatic differences in the ability of different phones to reliably make and maintain calls.
2005-01-03 Test experts ponder cost of defects
Is 100 DPPM too tough to be practical for designs in 100nm or finer processes?
2006-02-16 Test error rate with wideband signal generator
The article introduces the development background and technical specs of a next-gen wideband modulation signal generator.
2010-11-09 Test equipment revenue grows in 2010
Test equipment semiconductors revenue is expected to reach $6.7 billion in 2010 fuelled by demand from telecom and consumer electronics testing according to Databeans.
2015-02-13 Test equipment effectively manages power dissipation
Multitest said the add-on to the standard MT2168 can be mounted and demounted effortlessly and is geared for test development and high volume production.
2014-03-19 Test environment for multiple antennas in satellite
Elektrobit developed software-defined radio based environments aimed at satellite operators and infrastructure vendors, enabling them to scrutinize RF link performance.
2004-02-02 Test EMC using novel time-domain methods
This article covers new ways of signal processing to use time-domain measurement techniques to perform accurate and time efficient EMI measurements.
2011-08-15 Test device operates at -55CC175C
Multitest has introduced a 16-site tri-temp pick-and-place handler that features a range of options for advanced ESD protection.
2011-05-10 Test device adds XTC features
Multitest has announced that their MT9510 pick-and-place handler now provides extended temperature control with its extended temperature calibration (XTC) feature.
2010-11-04 Test dev software, PXI, FPGA products launched
Geotest updates ATEasy and launches new PXI digital & FGPA products.
2001-01-01 Test coverage enhancements at the register transfer level
This technology article describes the RTL buffer insertion and fault grading that helps identify untested functions and low-fault coverage areas where added test vectors can be generated.
2010-11-04 Test coverage analysis tool features yield estimation
ASTER's TestWay Express now allows estimates for new product yields
2004-04-21 Test consortium expands to China
The Semiconductor Test Consortium has signed an agreement with the China Beijing Semiconductor Industry Association (CBSIA) to collaborate on individual and joint activities aimed at promoting the consortium's charter and deployment of its Open Architecture test initiative in China.
2008-08-29 Test companies live up to the WiMAX challenge
In an effort to put complete WiMAX analysis in the hands of RF designers, test and measurement companies continue to develop software upgrades, spectrum analyzers, test sets and network analyzers to comply with the rapid build out of these wireless networks.
2005-10-07 Test clip creates new probe points
Emulation Technology has introduced its new MicroClip test clip that provides new or additional test points on existing PCBs by attaching to surface-mount passive components in 0201, 0402, 0603 and 0805 packages.
2006-11-03 Test challenges could trump future chip designs
Coming silicon process generations will bring not only immense increases in device density, but also the challenges of working with process and device variations that in many ways are worse than for the processes of 20 years ago.
2011-11-14 Test cases for China State Grid Specification
Read about the test procedures developed for the China State Grid specification-based electricity metering code.
2015-07-09 Test capacity issues resulting from mergers and acquisitions
Internal test providers might have more influence over platforms and configurations than external test providers, such as OSAT companies, but both largely install test capacity that is specified to them.
2010-05-01 Test by Mac
Hillcrest has licensed its Freespace motion control solution to TCL's current and future products. The first TCL smart TV use the software is expected out this month.
2000-11-22 Test Article by: Toper
The research focusing on spin-transfer torque magnetoresistive random access memory will run in the framework of Imec's R&D program on advanced emerging memory technologies.
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