Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > Advanced Search > test

test What is ATPG (Automatic Test Pattern Generation)? Search results

?
?
What is ATPG (Automatic Test Pattern Generation)?
The automatic creation of test patterns or "vectors" used to verify the operation of an electronic circuit. The "goodness" of a set of test vectors is based on "fault coverage" or the ability of the set of test vectors to identify any manufacturing or design defects in the circuit.
total search7983 articles
2010-07-31 test article
The new touchscreens from Synaptics can tell apart 10 simultaneous finger touches and complex multi-finger gestures, offering accuracy, low latency, high report rate and precise finger disambiguation.
2010-01-14 Test aims for standards flexibility combined with precision
Rohde & Schwarz's Erich Freund highlights changing requirements, particularly in communications--WiMAX, LTE, Wireless HD--and says test equipment must be flexible without sacrificing precision.
2015-04-14 Test adapter geared for SMARC computer-on-modules
The device from Yamaichi Electronics ensures a perfect alignment of the contacts and allows for 100 per cent contacting reliability up to 50k mechanical cycles.
2015-11-20 Test active optical cables during design, production
Testing and analysis done at critical junctures during the design process can further reduce costs by optimising the design for high yield given specified manufacturing tolerances.
2010-02-21 Test
Electronic products sometimes fail EMC just before they can hit the shelves. You can avoid the cost of redesign and device recall, and product launch delay with "pre-compliance."
2005-03-07 Tessolve opens IC test facility in Bangalore
Tessolve Inc. has started providing test services at its facility coming up in Bangalore, the first time an independent company has done so in India.
2004-02-20 Teseda, Agilent certify STIL link between DFT, production test
Teseda Corp. and Agilent Technologies Inc. have announced the first link that ensures transportability of Design-for-Test (DFT) data between engineering and production test platforms, wherein customers of the Teseda V500 and the Agilent 93000 SOC Series can quickly and reliably validate, debug, and apply IEEE 1450 (STIL)-based production test data generated by EDA tools.
2004-09-27 Teradyne, Spirent team up in telephone test solutions
Teradyne and Spirent Communications are working together towards DSL service assurance test solutions for telephone companies.
2002-05-23 Teradyne, Sony collaborate on cellular mobile test solution
Teradyne Inc.'s Assembly Test Division has formed a partnership with Sony Corp. to develop a functional test platform for Sony's range of cellular mobile products.
2004-05-20 Teradyne, ASE announce test system volume purchase
Teradyne Inc. and Advanced Semiconductor Engineering Inc. (ASE) have formed an agreement that integrates test system planning for all ASE sites, and includes the volume purchase of over 90 Teradyne test systems.
2004-09-28 Teradyne unveils new maintenance test system
Teradyne introduced and demonstrated its new portable maintenance test systemthe GDS-3100.
2002-10-21 Teradyne to test VIKO wireless devices
VIKO Technology Inc. has selected Teradyne Inc.'s Catalyst Test System to be used on a range of its wireless devices.
2003-08-14 Teradyne test system to be deployed by ULi
Teradyne has announced that ULi Electronics, a developer of core logic chipsets and related host-based peripherals, has selected its Tiger test system as the characterization and production solution for their Northbridge and Southbridge PC chips.
2004-07-15 Teradyne system to test Foveon image sensor
Foveon Inc. has selected the IP750 test system from Teradyne Inc. to be used in CMOS image sensor device test.
2005-03-17 Teradyne supplies RFID test systems to J750 systems
Teradyne Inc. disclosed that Beijing Huada, a VLSI testing service and solution provider for Beijing and Northern China, has purchased multiple J750 test systems to meet production capacity for RFID smart card testing.
2004-04-23 Teradyne sets up pin J750 test system in Russia
Teradyne Inc. has collaborated with Amideon Systems for the installation of the 512-pin J750 test system at the Scientific Research Institute of Electronic Engineering (RIEE) in Voronezh, Russia.
2005-05-02 Teradyne rolls new test tool
Teradyne announced an advanced vectorless test tool for detecting open pins on components and connectors assembled onto PCBs.
2004-11-10 Teradyne provides Infiniti with FLEX test system
Teradyne Inc. disclosed that Infiniti Solutions Ltd has purchased the FLEX test system to expand device test market opportunities for its test lab in Santa Clara, California.
2002-06-12 Teradyne partners with Test Insight for ATE development
Teradyne Inc. has entered into a partnership with Test Insight Ltd, wherein Teradyne will use the latter's WaveWizard test development product as part of its on-going program to develop advanced design-to-test solutions.
2002-09-06 Teradyne delivers optical test equipment to BISC
Teradyne's Assembly Test Division has received an order from Beijing International Switching System Corp. Ltd (BISC) for two Teradyne Optima 7300 post-reflow automated optical inspection systems.
2002-10-17 Teradyne bus test system emulates multiple protocols
Teradyne's Bi4-Series of serial bus test instruments is capable of emulating a wide range of bus protocols used in military and aerospace environments.
2004-03-17 Teradyne blasts U.S. export controls on test gear to China
IC test supplier Teradyne Inc. blasted new U.S export controls for China despite an effort to relax the rules on exports of automatic test equipment to China.
2005-12-01 Telematics needs universal test system
Find out if one system can fulfill the many needs of car manufacturers in testing telematics systems.
2002-11-29 Telecom test project stirs interest at Ixia
Motivating a team to design a compact test module for 40Gbps networks was not the easiest thing in the world at a time when market analysts were warning that 40Gb telecommunications transport would remain mired in overcapacity for quarters, or even years, to come.
2002-11-05 Telco purchases Motorola test equipment business
Motorola Inc. has entered into an agreement to sell the equipment repair and manufacturing assets of its Motorola Manufacturing Solutions test equipment business to Telco Inc.
2004-04-22 TEL test handler supports WLCSP, KGD technologies
Tokyo Electron has developed the WDF DP test handler that supports the WLCSP and KGD packaging and test technologies.
2002-08-07 Tektronix video test equipment to support CCTV
China Central Television has chosen Tektronix Inc.'s video test and monitoring solutions to support and maintain their new digital broadcast facilities.
2002-04-01 Tektronix upgrades optical test system with software toolkit
Tektronix Inc. has announced the OTS Toolkit software upgrade for its Optical Test System product family, and is aimed to support rapid design and production of optical network elements, while eliminating repetitive setup time and redundant test runs.
2004-10-04 Tektronix unveils new test suite version for K15 platform
The new version of Tektronix's software test suite for its K15 platform promises to provide enhanced productivity when testing 3G, 2G and 2.5G mobile services.
2006-10-11 Tektronix touts significant advancement in TDR test tech
According to Tektronix, its new time-domain-reflectometry (TDR) and electrical modules represent the most significant performance advancement in TDR test technology in 20 years.
Bloggers Say

Bloggers Say

See what engineers like you are posting on our pages.

?
?
Back to Top