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2008-02-05 Parametric probe cards cut testing costs at 45nm, beyond
Cascade Microtech has introduced two new Pyramid parametric probe cards that allow single-pass high-performance DC and RF measurements and reduce the cost of parametric production test for semiconductors at 65nm, 45nm and beyond.
2007-08-14 GbE module cuts testing costs, extend battery life
Anritsu has unveiled the new GbE module for CMA5000, which allows cost effective testing of complex converged Ethernet networks
2007-09-11 ZTE, Qualcomm complete first MBMS testing
ZTE announced that it has, in collaboration with Qualcomm, successfully completed an MBMS testing based on the 3GPP R6 standard conducted at its Shanghai Research and Development Center
2011-04-29 ZTE completes CDMA2000 1x IOT testing
ZTE Corp. unveils its completion of CDMA2000 1x Advanced IOT testing in partnership with Qualcomm Inc., which advances the commercial availability of the technology
2007-05-10 Zigbee software package enables low-cost, one-box testing
LitePoint Corp.'s Zigbee software package is said to provide test support for Zigbee 802.15.4-based products and can be used with existing LitePoint IQview and IQflex Test Solutions.
2004-04-16 Wireless manufacturers look to pare costs
A philosophy implemented by wireless manufacturers is to push a particular operation to the lowest possible level.
2008-07-21 Tool cuts testing time of device development code
Wind River Systems has added a scalable, distributed testing framework that connects device software development with quality assurance teams in a collaborative workflow
2005-02-23 The 'first system for deep level testing of 3G phone, USIM, network interoperability
Aspects announced what it claims as the industry's first system for deep level testing of 3G phone, USIM and network interoperability that can be deployed and used productively in less than half a day
2012-12-21 Testing EPC for precise LTE/4G billing structures
Through a full EPC evaluation using test tools for all mobile network elements from layer 2-7, service providers can meet the high demands of LTE while simultaneously making profits.
2009-06-12 T-Mobile taps R&S systems for mobile network testing
Mobile communications operator T-Mobile International has selected the Rohde & Schwarz group as the exclusive supplier of its standard drive test systems.
2015-06-25 Software development: Automated vs manual testing
Should we manually test applications or automate this process? Companies can get into a real dilemma trying to answer this question, but is there really a rivalry between these two testing techniques
2007-12-07 Software aids in DisplayPort compliance testing
Tektronix offers an early adopter software that fully implements and automates the tests identified in the DisplayPort physical layer source compliance test specification.
2005-03-01 Scalable load testing targets multi-service RF network gear
Tektronix's new LTS21, priced between about $300,000 and $1.5 million, shapes us as a configurable load test system.
2012-02-21 Research shows new battery reduces PV costs
Boasting an energy efficiency of 95 percent, lithium batteries are seen to replace lead acid types as an energy storage device in photovoltaic systems.
2006-09-16 Reducing the cost of cellphone testing
As phones increase in complexity, requiring more tests, manufacturers must find strategies that will keep rising test costs down
2008-07-21 Power MOSFET trims costs, touts higher efficiency
STMicroelectronics has unveiled a 250A surface-mount power MOSFET claimed to provide the lowest on-resistance to minimize energy conversion losses and enable higher performance.
2013-07-03 PCIe card from PLX to undercut Ethernet, Infiniband costs
PLX Technology's system is essentially a 96-port PCI Express Gen 3 switch that can deliver connections running at the equivalent of Infiniband QDR among a rack full of servers and storage arrays.
2012-03-22 OTDR touts smartphone UI for enterprise fiber testing
The OptiFiber Pro OTDR from Fluke Networks claims to support gesture-based commands and delivers technology enhancements that simplify testing in data centers
2001-04-15 New thinking needed amid runaway test costs
There is a need to achieve test-cost reductions that rival the reductions in wafer fabrication costs to ensure continued growth of semiconductor markets. ATE should not wait for someone else to do it
2011-10-11 Modular testing gains popularity due to DUT sophistication
The market for modular instruments with revenue of $524.3 million last year is seen to grow to $1.17 billion in 2017, according to a research firm.
2014-07-09 Minimising embedded software development costs
There are various effective test strategies for cutting development costs. Deciding what tests to employ is a bit of an art-form best guided by experience, but here are some tips on what's important
2004-07-30 Mindspeed ends backplane testing with Altera FPGAs
Mindspeed Technologies Inc. has completed the backplane interoperability testing of its family of crosspoint switches and clock-and-data-recovery circuits (CDRs) with Altera Corp.'s Stratix GX family of FPGAs
2003-05-06 Microchip buys Nextest systems for EEPROM testing
Microchip Technology Inc. has purchased Maverick II test systems from Nextest Systems Corp. for production testing of serial EEPROM devices used in automobiles and a myriad of consumer products
2015-06-17 Machine vision for automated LCD display testing
Read about a machine vision-based tool using a camera and Vision Option software from National Instruments for detecting dead pixels on LCD displays.
2009-04-01 LTE test system promises complete RF testing
AT4 wireless has unveiled the T4010 LTE RF test system, a complete and cost-effective platform to perform RF parameter verification throughout the development life of LTE-enabled user equipment.
2003-10-03 Life-long testing prescribed for chips
Chip testing strategies continue to perplex the industry as sub-100nm node designs become more commonplace
2010-05-28 High costs hurt energy efficiency drive
Government efforts to boost energy-saving product usage are driving China's "green" electronic exports but additional testing and certification costs are a concern particularly for voluntary standards.
2005-03-22 Fully-Buffered DIMM testing enhances logic analyzers
Tektronix now has a Fully-Buffered dual in-line memory module tester for logic analyzers.
2008-06-16 Flying probe system touts high-accuracy testing
Aeroflex has released the 4520 standalone flying probe system, a quick, easy and flexible solution to meet a variety of PCB testing needs
2016-01-05 Enhance test quality, minimise DFT costs
Learn about two test solutions that can be implemented to exploit additional advantages of hybrid silicon test solution.
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