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| 2002-09-16 | Enabling VDSM SoC revolution with mixed-signal design This article demonstrates how incorporating analog/mixed-signal design automation to existing chip trends can revolutionize VDSM SoCs. |
| 2000-11-01 | Increasing IC complexity disrupts the test model On-chip test circuitry is becoming crucial to the success of today's big designs. ATE manufacturers should beware. |
| 2001-04-15 | Hierarchical physical design for million-gate ASICs Raw design size in million-gated ASICs can cripple physical design and timing closure and the viable solution is physical hierarchy. |
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