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2002-09-16 Enabling VDSM SoC revolution with mixed-signal design
This article demonstrates how incorporating analog/mixed-signal design automation to existing chip trends can revolutionize VDSM SoCs.
2000-11-01 Increasing IC complexity disrupts the test model
On-chip test circuitry is becoming crucial to the success of today's big designs. ATE manufacturers should beware.
2001-04-15 Hierarchical physical design for million-gate ASICs
Raw design size in million-gated ASICs can cripple physical design and timing closure and the viable solution is physical hierarchy.
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