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EE Times Asia - total search?2?articles sort by date sort by relevance
Testing RF ICs with DigRF interconnects 2009-03-17
The content presented here covers four major areasdigital/physical, digital/protocol, RF/physical and RF/protocolbut focuses on the challenges of testing the RF ICs used in formats such as WiMAX and LTE ?
Improve volume production with non-signaling test 2012-05-15
Non-signaling is commonly used to describe the next-generation test techniques being developed within the cellular industry. ?


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